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dc.contributor.authorMora Cordova, Angel
dc.contributor.authorKhan, Kamran
dc.contributor.authorEl Sayed, Tamer S.
dc.date.accessioned2016-01-19T14:45:27Z
dc.date.available2016-01-19T14:45:27Z
dc.date.issued2014-06-11
dc.identifier.citationMora A, Khan KA, El Sayed T (2014) Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading. International Journal of Damage Mechanics 24: 546–561. Available: http://dx.doi.org/10.1177/1056789514539362.
dc.identifier.issn1056-7895
dc.identifier.issn1530-7921
dc.identifier.doi10.1177/1056789514539362
dc.identifier.urihttp://hdl.handle.net/10754/594296
dc.description.abstractWe present unified predictions for the crack onset strain, evolution of crack density, and changes in electrical resistance in indium tin oxide/polymer thin films under tensile loading. We propose a damage mechanics model to quantify and predict such changes as an alternative to fracture mechanics formulations. Our predictions are obtained by assuming that there are no flaws at the onset of loading as opposed to the assumptions of fracture mechanics approaches. We calibrate the crack onset strain and the damage model based on experimental data reported in the literature. We predict crack density and changes in electrical resistance as a function of the damage induced in the films. We implement our model in the commercial finite element software ABAQUS using a user subroutine UMAT. We obtain fair to good agreement with experiments. © The Author(s) 2014 Reprints and permissions: sagepub.co.uk/journalsPermissions.nav.
dc.description.sponsorshipThis work was fully funded by KAUST's research funds. We thank Prof. Gilles Lubineau and Mohamed A. Nasr Saleh from the COHMAS laboratory at KAUST for their support in providing us with microscope images showing crack evolution.
dc.publisherSAGE Publications
dc.subjectcrack density
dc.subjectDamage mechanics
dc.subjectindium tin oxide
dc.subjectthin films
dc.titlePrediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentMechanical Engineering Program
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Division
dc.identifier.journalInternational Journal of Damage Mechanics
kaust.personMora Cordova, Angel
kaust.personKhan, Kamran
kaust.personEl Sayed, Tamer S.
kaust.acknowledged.supportUnitCOHMAS laboratory
dc.date.published-online2014-06-11
dc.date.published-print2015-05


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