• Login
    View Item 
    •   Home
    • Research
    • Conference Papers
    • View Item
    •   Home
    • Research
    • Conference Papers
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Browse

    All of KAUSTCommunitiesIssue DateSubmit DateThis CollectionIssue DateSubmit Date

    My Account

    Login

    Quick Links

    Open Access PolicyORCID LibguidePlumX LibguideSubmit an Item

    Statistics

    Display statistics

    Thin Film growth and characterization of Ti doped ZnO by RF/DC magnetron sputtering

    • CSV
    • RefMan
    • EndNote
    • BibTex
    • RefWorks
    Type
    Conference Paper
    Authors
    Baseer Haider, M.
    Al-Kuhaili, Mohammad F.
    Durrani, S. M A
    Singaravelu, Venkatesh
    Roqan, Iman S. cc
    KAUST Department
    Material Science and Engineering Program
    Physical Science and Engineering (PSE) Division
    Semiconductor and Material Spectroscopy (SMS) Laboratory
    Thermal & Deposition
    Date
    2015-04-15
    Online Publication Date
    2015-04-15
    Print Publication Date
    2015
    Permanent link to this record
    http://hdl.handle.net/10754/594248
    
    Metadata
    Show full item record
    Abstract
    Thin film Ti doped ZnO (Ti-ZnO) film were grown on sapphire (0001) substrate by RF and DC magnetron sputtering. Films were grown at a substrate temperature of 250 °C with different Ti/Zn concentration. Surface chemical study of the samples was performed by X-ray photoelectron spectroscopy to determine the stoichiometry and Ti/Zn ratio for all samples. Surface morphology of the samples were studied by atomic force microscopy. X-ray diffraction was carried out to determine the crystallinity of the film. No secondary phases of TixOy was observed. We observed a slight increase in the lattice constant with the increase in Ti concentration in ZnO. No ferromagnetic signal was observed for any of the samples. However, some samples showed super-paramagnetic phase. © 2015 Materials Research Society.
    Citation
    Haider MB, Al-Kuhaili MF, Durrani SMA, Singaravelu V, Roqan I (2015) Thin Film growth and characterization of Ti doped ZnO by RF/DC magnetron sputtering. MRS Proceedings 1731. Available: http://dx.doi.org/10.1557/opl.2015.355.
    Publisher
    Cambridge University Press (CUP)
    Journal
    MRS Proceedings
    Conference/Event name
    2014 MRS Fall Meeting
    DOI
    10.1557/opl.2015.355
    ae974a485f413a2113503eed53cd6c53
    10.1557/opl.2015.355
    Scopus Count
    Collections
    Conference Papers; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program

    entitlement

     
    DSpace software copyright © 2002-2021  DuraSpace
    Quick Guide | Contact Us | Send Feedback
    Open Repository is a service hosted by 
    Atmire NV
     

    Export search results

    The export option will allow you to export the current search results of the entered query to a file. Different formats are available for download. To export the items, click on the button corresponding with the preferred download format.

    By default, clicking on the export buttons will result in a download of the allowed maximum amount of items. For anonymous users the allowed maximum amount is 50 search results.

    To select a subset of the search results, click "Selective Export" button and make a selection of the items you want to export. The amount of items that can be exported at once is similarly restricted as the full export.

    After making a selection, click one of the export format buttons. The amount of items that will be exported is indicated in the bubble next to export format.