Crack density and electrical resistance in indium-tin-oxide/polymer thin films under cyclic loading
Type
ArticleKAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionMechanical Engineering Program
Physical Science and Engineering (PSE) Division
Date
2014-11-10Online Publication Date
2014-11-10Print Publication Date
2014-11Permanent link to this record
http://hdl.handle.net/10754/594123
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Here, we propose a damage model that describes the degradation of the material properties of indium-tin-oxide (ITO) thin films deposited on polymer substrates under cyclic loading. We base this model on our earlier tensile test model and show that the new model is suitable for cyclic loading. After calibration with experimental data, we are able to capture the stress-strain behavior and changes in electrical resistance of ITO thin films. We are also able to predict the crack density using calibrations from our previous model. Finally, we demonstrate the capabilities of our model based on simulations using material properties reported in the literature. Our model is implemented in the commercially available finite element software ABAQUS using a user subroutine UMAT.[Figure not available: see fulltext.].Citation
Mora A, Khan KA, El Sayed T (2014) Crack density and electrical resistance in indium-tin-oxide/polymer thin films under cyclic loading. Electron Mater Lett 10: 1033–1037. Available: http://dx.doi.org/10.1007/s13391-014-3321-5.Publisher
Springer NatureJournal
Electronic Materials Lettersae974a485f413a2113503eed53cd6c53
10.1007/s13391-014-3321-5