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    Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices

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    Name:
    201509_Nanotechnology_IOP_Revision.pdf
    Size:
    637.2Kb
    Format:
    PDF
    Description:
    Accepted Manuscript
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    Type
    Article
    Authors
    Batra, Nitin M cc
    Patole, Shashikant P. cc
    Abdelkader, Ahmed
    Anjum, Dalaver H. cc
    Deepak, Francis L
    Da Costa, Pedro M. F. J. cc
    KAUST Department
    Electron Microscopy
    Imaging and Characterization Core Lab
    Material Science and Engineering Program
    Physical Science and Engineering (PSE) Division
    Date
    2015-10-09
    Online Publication Date
    2015-10-09
    Print Publication Date
    2015-11-06
    Permanent link to this record
    http://hdl.handle.net/10754/580007
    
    Metadata
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    Abstract
    The use of electron and ion beam deposition to make devices containing discrete nanostructures as interconnectors is a well-known nanofabrication process. Classically, one-dimensional materials such as carbon nanotubes (CNTs) have been electrically characterized by resorting to these beam deposition methods. While much attention has been given to the interconnectors, less is known about the contacting electrodes (or leads). In particular, the structure and chemistry of the electrode–interconnector interface is a topic that deserves more attention, as it is critical to understand the device behavior. Here, the structure and chemistry of Pt electrodes, deposited either with electron or ion beams and contacted to a CNT, are analyzed before and after thermally annealing the device in a vacuum. Free-standing Pt nanorods, acting as beam-deposited electrode models, are also characterized pre- and post-annealing. Overall, the as-deposited leads contain a non-negligible amount of amorphous carbon that is consolidated, upon heating, as a partially graphitized outer shell enveloping a Pt core. This observation raises pertinent questions regarding the definition of electrode–nanostructure interfaces in electrical devices, in particular long-standing assumptions of metal-CNT contacts fabricated by direct beam deposition methods.
    Citation
    Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices 2015, 26 (44):445301 Nanotechnology
    Publisher
    IOP Publishing
    Journal
    Nanotechnology
    DOI
    10.1088/0957-4484/26/44/445301
    PubMed ID
    26451669
    Additional Links
    http://stacks.iop.org/0957-4484/26/i=44/a=445301?key=crossref.389acc58e510bbe9744026bdd3303a2e
    ae974a485f413a2113503eed53cd6c53
    10.1088/0957-4484/26/44/445301
    Scopus Count
    Collections
    Articles; Imaging and Characterization Core Lab; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program

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