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    Direct Mismatch Characterization of femto-Farad Capacitors

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    07206545.pdf
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    Type
    Article
    Authors
    Omran, Hesham cc
    Elafandy, Rami T. cc
    Arsalan, Muhammad
    Salama, Khaled N. cc
    KAUST Department
    Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
    Electrical Engineering Program
    Date
    2015-08-17
    Online Publication Date
    2015-08-17
    Print Publication Date
    2016-02
    Permanent link to this record
    http://hdl.handle.net/10754/575242
    
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    Abstract
    Reducing the capacitance of programmable capacitor arrays, commonly used in analog integrated circuits, is necessary for low-energy applications. However, limited mismatch data is available for small capacitors. We report mismatch measurement for a 2fF poly-insulator-poly (PIP) capacitor, which is the smallest reported PIP capacitor to the best of the authors’ knowledge. Instead of using complicated custom onchip circuitry, direct mismatch measurement is demonstrated and verified using Monte Carlo Simulations and experimental measurements. Capacitive test structures composed of 9-bit programmable capacitor arrays (PCAs) are implemented in a low-cost 0:35m CMOS process. Measured data is compared to mismatch of large PIP capacitors, theoretical models, and recently published data. Measurement results indicate an estimated average relative standard deviation of 0.43% for the 2fF unit capacitor, which is better than the reported mismatch of metal-oxide-metal (MOM) fringing capacitors implemented in an advanced 32nm CMOS process.
    Citation
    Direct Mismatch Characterization of femto-Farad Capacitors 2015:1 IEEE Transactions on Circuits and Systems II: Express Briefs
    Publisher
    Institute of Electrical and Electronics Engineers (IEEE)
    Journal
    IEEE Transactions on Circuits and Systems II: Express Briefs
    DOI
    10.1109/TCSII.2015.2468919
    Additional Links
    http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=7206545
    ae974a485f413a2113503eed53cd6c53
    10.1109/TCSII.2015.2468919
    Scopus Count
    Collections
    Articles; Electrical Engineering Program; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

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