Show simple item record

dc.contributor.authorBalzer, Jonathan
dc.contributor.authorWerling, Stefan
dc.contributor.authorBeyerer, Jürgen
dc.date.accessioned2015-08-12T08:58:24Z
dc.date.available2015-08-12T08:58:24Z
dc.date.issued2011-01
dc.identifier.citationBalzer, J., Werling, S., & Beyerer, J. (2011). Lineare Deflektometrie — Regularisierung und experimentelles Design. Tm - Technisches Messen, 78(1). doi:10.1524/teme.2011.0078
dc.identifier.issn01718096
dc.identifier.doi10.1524/teme.2011.0078
dc.identifier.urihttp://hdl.handle.net/10754/565990
dc.description.abstractSpecular surfaces can be measured with deflectometric methods. The solutions form a one-parameter family whose properties are discussed in this paper. We show in theory and experiment that the shape sensitivity of solutions decreases with growing distance from the optical center of the imaging component of the sensor system and propose a novel regularization strategy. Recommendations for the construction of a measurement setup aim for benefiting this strategy as well as the contrarian standard approach of regularization by specular stereo. © Oldenbourg Wissenschaftsverlag.
dc.publisherWalter de Gruyter GmbH
dc.subject3d reconstruction
dc.subjectDeflectometry
dc.subjectInverse problems
dc.subjectRegularization
dc.titleLinear deflectometry - Regularization and experimental design [Lineare deflektometrie - Regularisierung und experimentelles design]
dc.typeArticle
dc.contributor.departmentVisual Computing Center (VCC)
dc.identifier.journaltm - Technisches Messen
dc.contributor.institutionFraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB, Abteilung Mess-, Regelungs- und Diagnosesysteme (MRD), Fraunhoferstraße 1, 76131 Karlsruhe Deutschland, Germany
kaust.personBalzer, Jonathan


This item appears in the following Collection(s)

Show simple item record