Linear deflectometry - Regularization and experimental design [Lineare deflektometrie - Regularisierung und experimentelles design]
dc.contributor.author | Balzer, Jonathan | |
dc.contributor.author | Werling, Stefan | |
dc.contributor.author | Beyerer, Jürgen | |
dc.date.accessioned | 2015-08-12T08:58:24Z | |
dc.date.available | 2015-08-12T08:58:24Z | |
dc.date.issued | 2011-01 | |
dc.identifier.citation | Balzer, J., Werling, S., & Beyerer, J. (2011). Lineare Deflektometrie — Regularisierung und experimentelles Design. Tm - Technisches Messen, 78(1). doi:10.1524/teme.2011.0078 | |
dc.identifier.issn | 01718096 | |
dc.identifier.doi | 10.1524/teme.2011.0078 | |
dc.identifier.uri | http://hdl.handle.net/10754/565990 | |
dc.description.abstract | Specular surfaces can be measured with deflectometric methods. The solutions form a one-parameter family whose properties are discussed in this paper. We show in theory and experiment that the shape sensitivity of solutions decreases with growing distance from the optical center of the imaging component of the sensor system and propose a novel regularization strategy. Recommendations for the construction of a measurement setup aim for benefiting this strategy as well as the contrarian standard approach of regularization by specular stereo. © Oldenbourg Wissenschaftsverlag. | |
dc.publisher | Walter de Gruyter GmbH | |
dc.subject | 3d reconstruction | |
dc.subject | Deflectometry | |
dc.subject | Inverse problems | |
dc.subject | Regularization | |
dc.title | Linear deflectometry - Regularization and experimental design [Lineare deflektometrie - Regularisierung und experimentelles design] | |
dc.type | Article | |
dc.contributor.department | Visual Computing Center (VCC) | |
dc.identifier.journal | tm - Technisches Messen | |
dc.contributor.institution | Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB, Abteilung Mess-, Regelungs- und Diagnosesysteme (MRD), Fraunhoferstraße 1, 76131 Karlsruhe Deutschland, Germany | |
kaust.person | Balzer, Jonathan |