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dc.contributor.authorAhmed, Rania F.
dc.contributor.authorRadwan, Ahmed G.
dc.contributor.authorMadian, Ahmed H.
dc.contributor.authorSoliman, Ahmed M.
dc.date.accessioned2015-08-04T07:01:48Z
dc.date.available2015-08-04T07:01:48Z
dc.date.issued2011-12
dc.identifier.citationAhmed, R. F., Radwan, A. G., Madian, A. H., & Soliman, A. M. (2011). Analog fault diagnosis by inverse problem technique. ICM 2011 Proceeding. doi:10.1109/icm.2011.6177361
dc.identifier.isbn9781457722073
dc.identifier.doi10.1109/ICM.2011.6177361
dc.identifier.urihttp://hdl.handle.net/10754/564469
dc.description.abstractA novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. © 2011 IEEE.
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.titleAnalog fault diagnosis by inverse problem technique
dc.typeConference Paper
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journalICM 2011 Proceeding
dc.conference.date19 December 2011 through 22 December 2011
dc.conference.name2011 23rd International Conference on Microelectronics, ICM 2011
dc.conference.locationHammamet
dc.contributor.institutionElectronics and Communication Department, Fayoum University, Fayoum, Egypt
dc.contributor.institutionApplied Engineering Mathematics Department, Cairo University, Egypt
dc.contributor.institutionDepartment of Engineering, NCRRT, Egyptian Atomic Energy Authority, Egypt
dc.contributor.institutionElectronics Department, Faculty of IET, German University in Cairo (GUC), Egypt
dc.contributor.institutionElectronics and Communication Department, Cairo University, Cairo, Egypt
kaust.personRadwan, Ahmed G.


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