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    Analog fault diagnosis by inverse problem technique

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    Type
    Conference Paper
    Authors
    Ahmed, Rania F.
    Radwan, Ahmed G.
    Madian, Ahmed H.
    Soliman, Ahmed M.
    KAUST Department
    Physical Science and Engineering (PSE) Division
    Date
    2011-12
    Permanent link to this record
    http://hdl.handle.net/10754/564469
    
    Metadata
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    Abstract
    A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. © 2011 IEEE.
    Citation
    Ahmed, R. F., Radwan, A. G., Madian, A. H., & Soliman, A. M. (2011). Analog fault diagnosis by inverse problem technique. ICM 2011 Proceeding. doi:10.1109/icm.2011.6177361
    Publisher
    Institute of Electrical and Electronics Engineers (IEEE)
    Journal
    ICM 2011 Proceeding
    Conference/Event name
    2011 23rd International Conference on Microelectronics, ICM 2011
    ISBN
    9781457722073
    DOI
    10.1109/ICM.2011.6177361
    ae974a485f413a2113503eed53cd6c53
    10.1109/ICM.2011.6177361
    Scopus Count
    Collections
    Conference Papers; Physical Science and Engineering (PSE) Division

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