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dc.contributor.authorAl-Falih, Hisham
dc.contributor.authorKhan, Yasser
dc.contributor.authorZhang, Yaping
dc.contributor.authorSan Roman Alerigi, Damian
dc.contributor.authorCha, Dong Kyu
dc.contributor.authorOoi, Boon S.
dc.contributor.authorNg, Tien Khee
dc.date.accessioned2015-08-04T07:01:34Z
dc.date.available2015-08-04T07:01:34Z
dc.date.issued2011-12
dc.identifier.citationAl-Falih, H., Yasser Khan, Yaping Zhang, Damain Pablo San-Roman-Alerigi, Cha, D., Boon Siew Ooi, & Ng, T. K. (2011). Fabrication of tuning-fork based AFM and STM tungsten probe. 8th International Conference on High-Capacity Optical Networks and Emerging Technologies. doi:10.1109/honet.2011.6149815
dc.identifier.isbn9781457711695
dc.identifier.doi10.1109/HONET.2011.6149815
dc.identifier.urihttp://hdl.handle.net/10754/564460
dc.description.abstractWe compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectatomic force microscopy
dc.subjectelectrochemical etching
dc.subjectscanning tunneling microscopy
dc.subjectTungsten probe
dc.subjecttuning-fork
dc.titleFabrication of tuning-fork based AFM and STM tungsten probe
dc.typeConference Paper
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Lab
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentCore Labs
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentImaging and Characterization Core Lab
dc.contributor.departmentPhotonics Laboratory
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.identifier.journal8th International Conference on High-capacity Optical Networks and Emerging Technologies
dc.conference.date19 December 2011 through 21 December 2011
dc.conference.name8th International Conference on High-Capacity Optical Networks and Emerging Technologies, HONET 2011
dc.conference.locationRiyadh
kaust.personKhan, Yasser
kaust.personCha, Dong Kyu
kaust.personOoi, Boon S.
kaust.personNg, Tien Khee
kaust.personAl-Falih, Hisham
kaust.personZhang, Yaping
kaust.personSan Roman Alerigi, Damian


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