Fabrication of tuning-fork based AFM and STM tungsten probe

Abstract
We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.

Citation
Al-Falih, H., Yasser Khan, Yaping Zhang, Damain Pablo San-Roman-Alerigi, Cha, D., Boon Siew Ooi, & Ng, T. K. (2011). Fabrication of tuning-fork based AFM and STM tungsten probe. 8th International Conference on High-Capacity Optical Networks and Emerging Technologies. doi:10.1109/honet.2011.6149815

Publisher
Institute of Electrical and Electronics Engineers (IEEE)

Journal
8th International Conference on High-capacity Optical Networks and Emerging Technologies

Conference/Event Name
8th International Conference on High-Capacity Optical Networks and Emerging Technologies, HONET 2011

DOI
10.1109/HONET.2011.6149815

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