Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)
KAUST DepartmentPhysical Sciences and Engineering (PSE) Division
Materials Science and Engineering Program
Permanent link to this recordhttp://hdl.handle.net/10754/564421
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AbstractV-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.
JournalJournal of Alloys and Compounds
Conference/Event nameProceedings of the 12th International Symposium on Metal-Hydrogen Systems, Fundamentals and Applications (MH2010)