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    Ultra-high resolution optical coherence tomography for encapsulation quality inspection

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    Type
    Article
    Authors
    Czajkowski, Jakub
    Fabritius, Tapio E J
    Ulański, Jacek P.
    Marszałek, Tomasz
    Gazicki-Lipman, Maciej
    Nosal, Andrzej
    Śliz, Rafal
    Alarousu, Erkki
    Prykäri, Tuukka
    Myllylä̈, Risto Antero
    Jabbour, Ghassan E.
    KAUST Department
    KAUST Solar Center (KSC)
    Physical Science and Engineering (PSE) Division
    Date
    2011-08-28
    Online Publication Date
    2011-08-28
    Print Publication Date
    2011-11
    Permanent link to this record
    http://hdl.handle.net/10754/564419
    
    Metadata
    Show full item record
    Abstract
    We present the application of ultra-high resolution optical coherence tomography (UHR-OCT) in evaluation of thin, protective films used in printed electronics. Two types of sample were investigated: microscopy glass and organic field effect transistor (OFET) structure. Samples were coated with thin (1-3 μm) layer of parylene C polymer. Measurements were done using experimental UHR-OCT device based on a Kerr-lens mode locked Ti: sapphire femtosecond laser, photonic crystal fibre and modified, free-space Michelson interferometer. Submicron resolution offered by the UHR-OCT system applied in the study enables registration of both interfaces of the thin encapsulation layer. Complete, volumetric characterisation of protective layers is presented, demonstrating possibility to use OCT for encapsulation quality inspection. © Springer-Verlag 2011.
    Citation
    Czajkowski, J., Fabritius, T., Ulański, J., Marszałek, T., Gazicki-Lipman, M., Nosal, A., … Jabbour, G. (2011). Ultra-high resolution optical coherence tomography for encapsulation quality inspection. Applied Physics B, 105(3), 649–657. doi:10.1007/s00340-011-4699-5
    Sponsors
    Presented study was done within PolyNet project and has been funded from the European Community's Seventh Framework Programme (FP7/2007-2013) under the grant agreement No. 214006. In addition, the authors would like to thank the Academy of Finland for the support in their research on UHR-OCT.
    Publisher
    Springer Nature
    Journal
    Applied Physics B
    DOI
    10.1007/s00340-011-4699-5
    ae974a485f413a2113503eed53cd6c53
    10.1007/s00340-011-4699-5
    Scopus Count
    Collections
    Articles; Physical Science and Engineering (PSE) Division; KAUST Solar Center (KSC)

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