Impact of scaling on the performance and reliability degradation of metal-contacts in NEMS devices
Type
Conference PaperAuthors
Dadgour, Hamed F.Hussain, Muhammad Mustafa
Cassell, Alan M.
Singh, Navab R.
Banerjee, Kaustav
KAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Integrated Nanotechnology Lab
Physical Science and Engineering (PSE) Division