Dielectric properties of PMMA-SiO2 hybrid films
dc.contributor.author | Morales-Acosta, M. D. | |
dc.contributor.author | Quevedo-López, Manuel Angel Quevedo | |
dc.contributor.author | Alshareef, Husam N. | |
dc.contributor.author | Gnade, Bruce E. | |
dc.contributor.author | Ramírez-Bon, Rafael | |
dc.date.accessioned | 2015-08-04T06:21:42Z | |
dc.date.available | 2015-08-04T06:21:42Z | |
dc.date.issued | 2010-03 | |
dc.identifier.citation | Morales-Acosta, M. D., Quevedo-López, M. A., Alshareef, H. N., Gnade, B. E., & Ramírez-Bon, R. (2010). Dielectric Properties of PMMA-SiO2 Hybrid Films. Materials Science Forum, 644, 25–28. doi:10.4028/www.scientific.net/msf.644.25 | |
dc.identifier.isbn | 087849281X; 9780878492817 | |
dc.identifier.issn | 02555476 | |
dc.identifier.doi | 10.4028/www.scientific.net/MSF.644.25 | |
dc.identifier.uri | http://hdl.handle.net/10754/564274 | |
dc.description.abstract | Organic-inorganic hybrid films were synthesized by a modified sol-gel process. PMMASiO2 films were prepared using methylmethacrylate (MMA), tetraethil-orthosilicate (TEOS) as silicon dioxide source, and 3-trimetoxi-silil-propil-methacrylate (TMSPM) as coupling agent. FTIR measurements were performed on the hybrid films to confirm the presence of PMMA-SiO2 bonding. In addition, metal-insulator-metal (MIM) devices were fabricated to study the dielectric constant of the films as function of frequency (1 KHz to 1 MHz). Electrical results show a weak trend of the dielectric constant of the hybrid films with MMA molar ratio. More importantly, the PMMA-SiO2 hybrid films showed a higher dielectric constant than SiO2 and PMMA layers, which is likely due to the presence of additional C-O-C bond. © (2010) Trans Tech Publications. | |
dc.publisher | Trans Tech Publications, Ltd. | |
dc.subject | Capacitor | |
dc.subject | Flexible electronics | |
dc.subject | Hybrid gate dielectric | |
dc.subject | Hybrid pmma-SiO2 | |
dc.subject | Organic-inorganic materials | |
dc.title | Dielectric properties of PMMA-SiO2 hybrid films | |
dc.type | Conference Paper | |
dc.contributor.department | Functional Nanomaterials and Devices Research Group | |
dc.contributor.department | Material Science and Engineering Program | |
dc.contributor.department | Physical Science and Engineering (PSE) Division | |
dc.identifier.journal | Materials Science Forum | |
dc.conference.date | 29 September 2009 through 2 October 2009 | |
dc.conference.name | 1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09 | |
dc.conference.location | Saltillo, Coahuila | |
dc.contributor.institution | CINVESTAV, Libram. Norponiente 2000 Fracc. Real de Juriquilla, Querétaro 76230, Qro., Mexico | |
dc.contributor.institution | Department of Material Science and Engineering, University of Texas at Dallas, Richardson 75083, TX, United States | |
kaust.person | Alshareef, Husam N. |
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Physical Science and Engineering (PSE) Division
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Material Science and Engineering Program
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