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    Flexible magnetoimpedance sensor

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    Type
    Article
    Authors
    Li, Bodong cc
    Kavaldzhiev, Mincho cc
    Kosel, Jürgen cc
    KAUST Department
    Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
    Electrical Engineering Program
    Sensing, Magnetism and Microsystems Lab
    Date
    2015-03
    Permanent link to this record
    http://hdl.handle.net/10754/564074
    
    Metadata
    Show full item record
    Abstract
    Flexible magnetoimpedance (MI) sensors fabricated using a NiFe/Cu/NiFe tri-layer on Kapton substrate have been studied. A customized flexible microstrip transmission line was employed to investigate the MI sensors's magnetic field and frequency responses and their dependence on the sensors's deflection. For the first time, the impedance characteristic is obtained through reflection coefficient analysis over a wide range of frequencies from 0.1 MHz to 3 GHz and for deflections ranging from zero curvature to a radius of 7.2 cm. The sensor element maintains a high MI ratio of up to 90% and magnetic sensitivity of up to 9.2%/Oe over different bending curvatures. The relationship between the curvature and material composition is discussed based on the magnetostriction effect and stress simulations. The sensor's large frequency range, simple fabrication process and high sensitivity provide a great potential for flexible electronics and wireless applications.
    Citation
    Li, B., Kavaldzhiev, M. N., & Kosel, J. (2015). Flexible magnetoimpedance sensor. Journal of Magnetism and Magnetic Materials, 378, 499–505. doi:10.1016/j.jmmm.2014.11.067
    Sponsors
    Research reported in this publication was supported by the King Abdullah University of Science and Technology (KAUST).
    Publisher
    Elsevier BV
    Journal
    Journal of Magnetism and Magnetic Materials
    DOI
    10.1016/j.jmmm.2014.11.067
    ae974a485f413a2113503eed53cd6c53
    10.1016/j.jmmm.2014.11.067
    Scopus Count
    Collections
    Articles; Electrical and Computer Engineering Program; Sensing, Magnetism and Microsystems Lab; Computer, Electrical and Mathematical Science and Engineering (CEMSE) Division

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