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    Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

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    Type
    Article
    Authors
    Alaie, Seyedhamidreza
    Goettler, Drew F.
    Jiang, Yingbing
    Abbas, Khawar
    Baboly, Mohammadhosein Ghasemi
    Anjum, Dalaver H. cc
    Chaieb, Saharoui cc
    Leseman, Zayd Chad
    KAUST Department
    Advanced Nanofabrication, Imaging and Characterization Core Lab
    Bioscience Program
    Core Labs
    Electron Microscopy
    Mechanical Engineering Program
    Physical Science and Engineering (PSE) Division
    Date
    2015-02-04
    Online Publication Date
    2015-02-04
    Print Publication Date
    2015-02-27
    Permanent link to this record
    http://hdl.handle.net/10754/564044
    
    Metadata
    Show full item record
    Abstract
    Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.
    Citation
    Alaie, S., Goettler, D. F., Jiang, Y.-B., Abbas, K., Baboly, M. G., Anjum, D. H., … Leseman, Z. C. (2015). Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam. Nanotechnology, 26(8), 085704. doi:10.1088/0957-4484/26/8/085704
    Sponsors
    This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.
    Publisher
    IOP Publishing
    Journal
    Nanotechnology
    DOI
    10.1088/0957-4484/26/8/085704
    ae974a485f413a2113503eed53cd6c53
    10.1088/0957-4484/26/8/085704
    Scopus Count
    Collections
    Articles; Bioscience Program; Imaging and Characterization Core Lab; Physical Science and Engineering (PSE) Division; Mechanical Engineering Program

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