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dc.contributor.authorYang, Yang
dc.contributor.authorYao, Yingbang
dc.contributor.authorZhang, Q.
dc.contributor.authorZhang, Xixiang
dc.date.accessioned2015-08-03T12:15:54Z
dc.date.available2015-08-03T12:15:54Z
dc.date.issued2014-11
dc.identifier.issn09242031
dc.identifier.doi10.1016/j.vibspec.2014.10.005
dc.identifier.urihttp://hdl.handle.net/10754/563828
dc.description.abstractPolarized Raman spectroscopy was used to study the lattice structure of BiFeO3 films on different substrates prepared by pulsed laser deposition. Interestingly, the Raman spectra of BiFeO3 films exhibit distinct polarization dependences. The symmetries of the fundamental Raman modes in 50-700 cm-1 were identified based on group theory. The symmetries of the high order Raman modes in 900-1500 cm-1 of BiFeO3 are determined for the first time, which can provide strong clarifications to the symmetry of the fundamental peaks in 400-700 cm-1 in return. Moreover, the lattice structures of BiFeO3 films are identified consequently on the basis of Raman spectroscopy. BiFeO3 films on SrRuO3 coated SrTiO3 (0 0 1) substrate, CaRuO3 coated SrTiO3 (0 0 1) substrate and tin-doped indium oxide substrate are found to be in the rhombohedral structure, while BiFeO3 film on SrRuO3 coated Nb: SrTiO3 (0 0 1) substrate is in the monoclinic structure. Our results suggest that polarized Raman spectroscopy would be a feasible tool to study the lattice structure of BiFeO3 films.
dc.publisherElsevier BV
dc.subjectBiFeO3 films
dc.subjectPolarized Raman spectroscopy
dc.subjectPulsed laser deposition
dc.subjectSubstrates
dc.titlePolarized Raman study on the lattice structure of BiFeO3 films prepared by pulsed laser deposition
dc.typeArticle
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Lab
dc.contributor.departmentCore Labs
dc.contributor.departmentMaterials Science and Engineering Program
dc.contributor.departmentPhysical Characterization
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Division
dc.contributor.departmentThin Films & Characterization
dc.identifier.journalVibrational Spectroscopy
kaust.personYang, Yang
kaust.personYao, Yingbang
kaust.personZhang, Xixiang
kaust.personZhang, Q.


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