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    Polarized Raman study on the lattice structure of BiFeO3 films prepared by pulsed laser deposition

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    Type
    Article
    Authors
    Yang, Yang
    Yao, Yingbang
    Zhang, Q.
    Zhang, Xixiang cc
    KAUST Department
    Advanced Nanofabrication, Imaging and Characterization Core Lab
    Core Labs
    Material Science and Engineering Program
    Physical Characterization
    Physical Science and Engineering (PSE) Division
    Thin Films & Characterization
    Date
    2014-11
    Permanent link to this record
    http://hdl.handle.net/10754/563828
    
    Metadata
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    Abstract
    Polarized Raman spectroscopy was used to study the lattice structure of BiFeO3 films on different substrates prepared by pulsed laser deposition. Interestingly, the Raman spectra of BiFeO3 films exhibit distinct polarization dependences. The symmetries of the fundamental Raman modes in 50-700 cm-1 were identified based on group theory. The symmetries of the high order Raman modes in 900-1500 cm-1 of BiFeO3 are determined for the first time, which can provide strong clarifications to the symmetry of the fundamental peaks in 400-700 cm-1 in return. Moreover, the lattice structures of BiFeO3 films are identified consequently on the basis of Raman spectroscopy. BiFeO3 films on SrRuO3 coated SrTiO3 (0 0 1) substrate, CaRuO3 coated SrTiO3 (0 0 1) substrate and tin-doped indium oxide substrate are found to be in the rhombohedral structure, while BiFeO3 film on SrRuO3 coated Nb: SrTiO3 (0 0 1) substrate is in the monoclinic structure. Our results suggest that polarized Raman spectroscopy would be a feasible tool to study the lattice structure of BiFeO3 films.
    Publisher
    Elsevier BV
    Journal
    Vibrational Spectroscopy
    DOI
    10.1016/j.vibspec.2014.10.005
    ae974a485f413a2113503eed53cd6c53
    10.1016/j.vibspec.2014.10.005
    Scopus Count
    Collections
    Articles; Imaging and Characterization Core Lab; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program

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