Reactively sputtered epitaxial γ′-Fe4N films: Surface morphology, microstructure, magnetic and electrical transport properties
Type
ArticleKAUST Department
Imaging and Characterization Core LabCore Labs
Date
2013-10Permanent link to this record
http://hdl.handle.net/10754/563019
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Show full item recordAbstract
Epitaxial γ′-Fe4N films with (1 0 0) and (1 1 0) orientations have been fabricated by reactive sputtering; these films were characterized by X-ray θ-2θ and φ scans, pole figures and high-resolution transmission electron microscopy. The film surface is very smooth as the film is less than 58 nm thick. The films exhibit soft ferromagnetism, and the saturation magnetization decreases with an increase in temperature, following Bloch's spin wave theory. The films also exhibit a metallic conductance mechanism. Below 30 K, magnetoresistance (MR) is positive and increases linearly with the applied field in the high-field range. In the low-field range, MR increases abruptly. Above 30 K, MR is negative, and its value increases linearly with the applied field.Citation
Mi, W. B., Guo, Z. B., Feng, X. P., & Bai, H. L. (2013). Reactively sputtered epitaxial γ′-Fe4N films: Surface morphology, microstructure, magnetic and electrical transport properties. Acta Materialia, 61(17), 6387–6395. doi:10.1016/j.actamat.2013.07.016Sponsors
This work was supported by the National Natural Foundation of China (51172126) and the Key Project of Natural Foundation of Tianjin City (12JCZDJC27100).Publisher
Elsevier BVJournal
Acta Materialiaae974a485f413a2113503eed53cd6c53
10.1016/j.actamat.2013.07.016