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dc.contributor.authorYao, Yingbang
dc.contributor.authorChan, H. T.
dc.contributor.authorMak, C. L.
dc.contributor.authorWong, Kinhung
dc.date.accessioned2015-08-03T11:06:01Z
dc.date.available2015-08-03T11:06:01Z
dc.date.issued2013-06
dc.identifier.issn00406090
dc.identifier.doi10.1016/j.tsf.2013.04.043
dc.identifier.urihttp://hdl.handle.net/10754/562794
dc.description.abstractLead-free piezoelectric thin films, (K0.5Na0.5) 0.96Li0.04(Nb0.8Ta0.2)O 3, were epitaxially grown on MgO(001) and Nb-doped SrTiO 3(001) substrates using pulsed laser deposition. The optimum deposition temperature was found to be 600 C. Two types of in-plane orientations were observed in the films depending on the substrates used. The transmittance and photoluminescence spectra as well as the dielectric and ferroelectric properties of the films were measured. The measured band-gap energy was found to be decreased with the deposition temperature. The dielectric constant decreased from 550 to 300 as the frequency increased from 100 Hz to 1 MHz. The measured remnant polarization and coercive field were 4 μC/cm2 and 68 kV/cm, respectively. The phase transitions of the films were studied by Raman spectroscopy. Two distinct anomalies originating from the cubic-to-tetragonal (TC-T ~ 300 C) and tetragonal-to-orthorhombic (TT-O ~ 120 C) phase transitions were observed. Our results show that Raman spectroscopy is a powerful tool in identifying the phase transitions in ferroelectric thin films. © 2013 Elsevier B.V.
dc.description.sponsorshipThis research was supported by a research grant of the Hong Kong Polytechnic University (GU693).
dc.publisherElsevier BV
dc.subjectKNN-LT
dc.subjectLead-free piezoelectric
dc.subjectOptical properties
dc.subjectPhase transition
dc.subjectPulse laser deposition
dc.subjectRaman spectroscopy
dc.titlePhase transitions and optical characterization of lead-free piezoelectric (K0.5Na0.5)0.96Li0.04(Nb 0.8Ta0.2)O3 thin films
dc.typeArticle
dc.contributor.departmentImaging and Characterization Core Lab
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Lab
dc.contributor.departmentCore Labs
dc.identifier.journalThin Solid Films
dc.contributor.institutionDepartment of Applied Physics, Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong
kaust.personYao, Yingbang


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