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    Phase transitions and optical characterization of lead-free piezoelectric (K0.5Na0.5)0.96Li0.04(Nb 0.8Ta0.2)O3 thin films

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    Type
    Article
    Authors
    Yao, Yingbang
    Chan, H. T.
    Mak, C. L.
    Wong, Kinhung
    KAUST Department
    Imaging and Characterization Core Lab
    Advanced Nanofabrication, Imaging and Characterization Core Lab
    Core Labs
    Date
    2013-06
    Permanent link to this record
    http://hdl.handle.net/10754/562794
    
    Metadata
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    Abstract
    Lead-free piezoelectric thin films, (K0.5Na0.5) 0.96Li0.04(Nb0.8Ta0.2)O 3, were epitaxially grown on MgO(001) and Nb-doped SrTiO 3(001) substrates using pulsed laser deposition. The optimum deposition temperature was found to be 600 C. Two types of in-plane orientations were observed in the films depending on the substrates used. The transmittance and photoluminescence spectra as well as the dielectric and ferroelectric properties of the films were measured. The measured band-gap energy was found to be decreased with the deposition temperature. The dielectric constant decreased from 550 to 300 as the frequency increased from 100 Hz to 1 MHz. The measured remnant polarization and coercive field were 4 μC/cm2 and 68 kV/cm, respectively. The phase transitions of the films were studied by Raman spectroscopy. Two distinct anomalies originating from the cubic-to-tetragonal (TC-T ~ 300 C) and tetragonal-to-orthorhombic (TT-O ~ 120 C) phase transitions were observed. Our results show that Raman spectroscopy is a powerful tool in identifying the phase transitions in ferroelectric thin films. © 2013 Elsevier B.V.
    Citation
    Yao, Y. B., Chan, H. T., Mak, C. L., & Wong, K. H. (2013). Phase transitions and optical characterization of lead-free piezoelectric (K0.5Na0.5)0.96Li0.04(Nb0.8Ta0.2)O3 thin films. Thin Solid Films, 537, 156–162. doi:10.1016/j.tsf.2013.04.043
    Sponsors
    This research was supported by a research grant of the Hong Kong Polytechnic University (GU693).
    Publisher
    Elsevier BV
    Journal
    Thin Solid Films
    DOI
    10.1016/j.tsf.2013.04.043
    ae974a485f413a2113503eed53cd6c53
    10.1016/j.tsf.2013.04.043
    Scopus Count
    Collections
    Articles; Imaging and Characterization Core Lab

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