Long-term RF burn-in effects on dielectric charging of MEMS capacitive switches
Type
ArticleAuthors
Molinero, David G.Luo, Xi
Shen, Chao
Palego, Cristiano
Hwang, James
Goldsmith, Charles L.
KAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Material Science and Engineering Program
Materials Science and Engineering Program