Type
ArticleAuthors
Li, JingqiZhao, Chao

Wang, Qingxiao
Zhang, Qiang

Wang, Zhihong
Zhang, Xixiang

Abutaha, Anas I.

Alshareef, Husam N.

KAUST Department
Advanced Nanofabrication, Imaging and Characterization Core LabCore Labs
Functional Nanomaterials and Devices Research Group
Imaging and Characterization Core Lab
Material Science and Engineering Program
Physical Science and Engineering (PSE) Division
Date
2012-10Permanent link to this record
http://hdl.handle.net/10754/562335
Metadata
Show full item recordAbstract
Vertically aligned carbon nanotube field-effect transistors (CNTFETs) have been developed using pure semiconducting carbon nanotubes. The source and drain were vertically stacked, separated by a dielectric, and the carbon nanotubes were placed on the sidewall of the stack to bridge the source and drain. Both the effective gate dielectric and gate electrode were normal to the substrate surface. The channel length is determined by the dielectric thickness between source and drain electrodes, making it easier to fabricate sub-micrometer transistors without using time-consuming electron beam lithography. The transistor area is much smaller than the planar CNTFET due to the vertical arrangement of source and drain and the reduced channel area. © 2012 Elsevier Ltd. All rights reserved.Citation
Li, J., Zhao, C., Wang, Q., Zhang, Q., Wang, Z., Zhang, X. X., … Alshareef, H. N. (2012). Vertically aligned carbon nanotube field-effect transistors. Carbon, 50(12), 4628–4632. doi:10.1016/j.carbon.2012.05.049Publisher
Elsevier BVJournal
Carbonae974a485f413a2113503eed53cd6c53
10.1016/j.carbon.2012.05.049