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    Vertically aligned carbon nanotube field-effect transistors

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    Type
    Article
    Authors
    Li, Jingqi
    Zhao, Chao cc
    Wang, Qingxiao
    Zhang, Qiang cc
    Wang, Zhihong
    Zhang, Xixiang cc
    Abutaha, Anas I. cc
    Alshareef, Husam N. cc
    KAUST Department
    Advanced Nanofabrication, Imaging and Characterization Core Lab
    Core Labs
    Functional Nanomaterials and Devices Research Group
    Imaging and Characterization Core Lab
    Material Science and Engineering Program
    Physical Science and Engineering (PSE) Division
    Date
    2012-10
    Permanent link to this record
    http://hdl.handle.net/10754/562335
    
    Metadata
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    Abstract
    Vertically aligned carbon nanotube field-effect transistors (CNTFETs) have been developed using pure semiconducting carbon nanotubes. The source and drain were vertically stacked, separated by a dielectric, and the carbon nanotubes were placed on the sidewall of the stack to bridge the source and drain. Both the effective gate dielectric and gate electrode were normal to the substrate surface. The channel length is determined by the dielectric thickness between source and drain electrodes, making it easier to fabricate sub-micrometer transistors without using time-consuming electron beam lithography. The transistor area is much smaller than the planar CNTFET due to the vertical arrangement of source and drain and the reduced channel area. © 2012 Elsevier Ltd. All rights reserved.
    Citation
    Li, J., Zhao, C., Wang, Q., Zhang, Q., Wang, Z., Zhang, X. X., … Alshareef, H. N. (2012). Vertically aligned carbon nanotube field-effect transistors. Carbon, 50(12), 4628–4632. doi:10.1016/j.carbon.2012.05.049
    Publisher
    Elsevier BV
    Journal
    Carbon
    DOI
    10.1016/j.carbon.2012.05.049
    ae974a485f413a2113503eed53cd6c53
    10.1016/j.carbon.2012.05.049
    Scopus Count
    Collections
    Articles; Imaging and Characterization Core Lab; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program

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