Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Type
Article
Authors
Li, Ruipeng
Ward, Jeremy W.
Smilgies, Detlef Matthias
Payne, Marcia M.
Anthony, John Edward
Jurchescu, Oana D. cc
Amassian, Aram cc
KAUST Department
KAUST Solar Center (KSC)
Material Science and Engineering Program
Organic Electronics and Photovoltaics Group
Physical Science and Engineering (PSE) Division
KAUST Grant Number
FIC/2010/04
Date
2012-08-10
Online Publication Date
2012-08-10
Print Publication Date
2012-11-02
Permanent link to this record
http://hdl.handle.net/10754/562273

Metadata
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Abstract
X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Citation
Li, R., Ward, J. W., Smilgies, D.-M., Payne, M. M., Anthony, J. E., Jurchescu, O. D., & Amassian, A. (2012). Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport. Advanced Materials, 24(41), 5553–5558. doi:10.1002/adma.201201856
Sponsors
We are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.
Publisher
Wiley
Journal
Advanced Materials
DOI
10.1002/adma.201201856
PubMed ID
22887742
Collections
Articles; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program; KAUST Solar Center (KSC)