Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport
Ward, Jeremy W.
Smilgies, Detlef Matthias
Payne, Marcia M.
Anthony, John Edward
Jurchescu, Oana D.
KAUST DepartmentKAUST Solar Center (KSC)
Material Science and Engineering Program
Organic Electronics and Photovoltaics Group
Physical Science and Engineering (PSE) Division
KAUST Grant NumberFIC/2010/04
Online Publication Date2012-08-10
Print Publication Date2012-11-02
Permanent link to this recordhttp://hdl.handle.net/10754/562273
MetadataShow full item record
AbstractX-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
SponsorsWe are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.
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