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    Strong temperature dependence of extraordinary magnetoresistance correlated to mobility in a two-contact device

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    Type
    Article
    Authors
    Sun, Jian
    Patil, Samadhan B.
    Soh, Yeongah
    Kose, Jürgen
    KAUST Department
    Electrical Engineering Program
    Physical Science and Engineering (PSE) Division
    Date
    2012-02-21
    Permanent link to this record
    http://hdl.handle.net/10754/562097
    
    Metadata
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    Abstract
    A two-contact extraordinary magnetoresistance (EMR) device has been fabricated and characterized at various temperatures under magnetic fields applied in different directions. Large performance variations across the temperature range have been found, which are due to the strong dependence of the EMR effect on the mobility. The device shows the highest sensitivity of 562ω/T at 75 K with the field applied perpendicularly. Due to the overlap between the semiconductor and the metal shunt, the device is also sensitive to planar fields but with a lower sensitivity of about 20 to 25% of the one to perpendicular fields. © 2012 The Japan Society of Applied Physics.
    Citation
    Sun, J., Patil, S. B., Soh, Y.-A., & Kosel, J. (2012). Strong Temperature Dependence of Extraordinary Magnetoresistance Correlated to Mobility in a Two-Contact Device. Applied Physics Express, 5(3), 033002. doi:10.1143/apex.5.033002
    Publisher
    IOP Publishing
    Journal
    Applied Physics Express
    DOI
    10.1143/APEX.5.033002
    ae974a485f413a2113503eed53cd6c53
    10.1143/APEX.5.033002
    Scopus Count
    Collections
    Articles; Physical Science and Engineering (PSE) Division; Electrical and Computer Engineering Program

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