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dc.contributor.authorSalem, Mohamed
dc.contributor.authorBagci, Hakan
dc.date.accessioned2015-08-03T09:35:07Z
dc.date.available2015-08-03T09:35:07Z
dc.date.issued2011-12-23
dc.identifier.issn10847529
dc.identifier.pmid22218361
dc.identifier.doi10.1364/JOSAA.29.000139
dc.identifier.urihttp://hdl.handle.net/10754/561962
dc.description.abstractThe reflection and transmission of full-vector X waves normally incident on planar half-spaces and slabs are studied. For this purpose, X waves are expanded in terms of weighted vector Bessel beams; this new decomposition and reconstruction method offers a more lucid and intuitive interpretation of the physical phenomena observed upon the reflection or transmission of X waves when compared to the conventional plane-wave decomposition technique. Using the Bessel beam expansion approach, we have characterized changes in the field shape and the intensity distribution of the transmitted and reflected full-vector X waves. We have also identified a novel longitudinal shift, which is observed when a full-vector X wave is transmitted through a dielectric slab under frustrated total reflection condition. The results of our studies presented here are valuable in understanding the behavior of full-vector X waves when they are utilized in practical applications in electromagnetics, optics, and photonics, such as trap and tweezer setups, optical lithography, and immaterial probing. © 2011 Optical Society of America.
dc.publisherThe Optical Society
dc.titleReflection and transmission of normally incident full-vector X waves on planar interfaces
dc.typeArticle
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Division
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentComputational Electromagnetics Laboratory
dc.identifier.journalJournal of the Optical Society of America A
kaust.personSalem, Mohamed
kaust.personBagci, Hakan


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