Reflection and transmission of normally incident full-vector X waves on planar interfaces
Type
ArticleAuthors
Salem, MohamedBagci, Hakan

KAUST Department
Computational Electromagnetics LaboratoryComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
Physical Science and Engineering (PSE) Division
Date
2011-12-23Online Publication Date
2011-12-23Print Publication Date
2012-01-01Permanent link to this record
http://hdl.handle.net/10754/561962
Metadata
Show full item recordAbstract
The reflection and transmission of full-vector X waves normally incident on planar half-spaces and slabs are studied. For this purpose, X waves are expanded in terms of weighted vector Bessel beams; this new decomposition and reconstruction method offers a more lucid and intuitive interpretation of the physical phenomena observed upon the reflection or transmission of X waves when compared to the conventional plane-wave decomposition technique. Using the Bessel beam expansion approach, we have characterized changes in the field shape and the intensity distribution of the transmitted and reflected full-vector X waves. We have also identified a novel longitudinal shift, which is observed when a full-vector X wave is transmitted through a dielectric slab under frustrated total reflection condition. The results of our studies presented here are valuable in understanding the behavior of full-vector X waves when they are utilized in practical applications in electromagnetics, optics, and photonics, such as trap and tweezer setups, optical lithography, and immaterial probing. © 2011 Optical Society of America.Citation
Salem, M. A., & Bağcı, H. (2011). Reflection and transmission of normally incident full-vector X waves on planar interfaces. Journal of the Optical Society of America A, 29(1), 139. doi:10.1364/josaa.29.000139Publisher
The Optical SocietyPubMed ID
22218361ae974a485f413a2113503eed53cd6c53
10.1364/JOSAA.29.000139
Scopus Count
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