Reflection and transmission of normally incident full-vector X waves on planar interfaces
KAUST DepartmentComputational Electromagnetics Laboratory
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
Physical Science and Engineering (PSE) Division
Online Publication Date2011-12-23
Print Publication Date2012-01-01
Permanent link to this recordhttp://hdl.handle.net/10754/561962
MetadataShow full item record
AbstractThe reflection and transmission of full-vector X waves normally incident on planar half-spaces and slabs are studied. For this purpose, X waves are expanded in terms of weighted vector Bessel beams; this new decomposition and reconstruction method offers a more lucid and intuitive interpretation of the physical phenomena observed upon the reflection or transmission of X waves when compared to the conventional plane-wave decomposition technique. Using the Bessel beam expansion approach, we have characterized changes in the field shape and the intensity distribution of the transmitted and reflected full-vector X waves. We have also identified a novel longitudinal shift, which is observed when a full-vector X wave is transmitted through a dielectric slab under frustrated total reflection condition. The results of our studies presented here are valuable in understanding the behavior of full-vector X waves when they are utilized in practical applications in electromagnetics, optics, and photonics, such as trap and tweezer setups, optical lithography, and immaterial probing. © 2011 Optical Society of America.
CitationSalem, M. A., & Bağcı, H. (2011). Reflection and transmission of normally incident full-vector X waves on planar interfaces. Journal of the Optical Society of America A, 29(1), 139. doi:10.1364/josaa.29.000139
PublisherThe Optical Society
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