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    A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations

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    Type
    Conference Paper
    Authors
    Rabie, Mohamed A.
    Bahgat, Ahmed B G
    Ramadan, Khaled S.
    Shobak, Hosam
    Nasr, Tarek Adel Hosny
    Abdelhafez, Mohamed R.
    Moustafa, Eslam M.
    Anis, Mohab H.
    KAUST Department
    Electrical Engineering Program
    Date
    2011-11
    Permanent link to this record
    http://hdl.handle.net/10754/561914
    
    Metadata
    Show full item record
    Abstract
    Semi-Dynamic Flip-Flops are widely used in state-of-art microprocessors. Moreover, scaling down traditional CMOS technology faces major challenges which rises the need for new devices for replacement. FinFET technology is a potential replacement due to similarity in both fabrication process and theory of operation to current CMOS technology. Hence, this paper presents the study of Semi Dynamic Flip Flops using both Independent gate and Tied gate FinFET devices in 32nm technology node. Furthermore, it studies the performance of these new circuits under process variations. © 2011 IEEE.
    Citation
    Rabie, M., Bahgat, A., Ramadan, K., Shobak, H., Nasr, T., Abdelhafez, M., … Anis, M. (2011). A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. 2011 International Conference on Energy Aware Computing. doi:10.1109/iceac.2011.6136674
    Publisher
    Institute of Electrical and Electronics Engineers (IEEE)
    Journal
    2011 International Conference on Energy Aware Computing
    Conference/Event name
    2011 International Conference on Energy Aware Computing, ICEAC 2011
    ISBN
    9781467304658
    DOI
    10.1109/ICEAC.2011.6136674
    ae974a485f413a2113503eed53cd6c53
    10.1109/ICEAC.2011.6136674
    Scopus Count
    Collections
    Conference Papers; Electrical and Computer Engineering Program

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