A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations
Type
Conference PaperAuthors
Rabie, Mohamed A.Bahgat, Ahmed B G
Ramadan, Khaled S.
Shobak, Hosam
Nasr, Tarek Adel Hosny
Abdelhafez, Mohamed R.
Moustafa, Eslam M.
Anis, Mohab H.
KAUST Department
Electrical Engineering ProgramDate
2011-11Permanent link to this record
http://hdl.handle.net/10754/561914
Metadata
Show full item recordAbstract
Semi-Dynamic Flip-Flops are widely used in state-of-art microprocessors. Moreover, scaling down traditional CMOS technology faces major challenges which rises the need for new devices for replacement. FinFET technology is a potential replacement due to similarity in both fabrication process and theory of operation to current CMOS technology. Hence, this paper presents the study of Semi Dynamic Flip Flops using both Independent gate and Tied gate FinFET devices in 32nm technology node. Furthermore, it studies the performance of these new circuits under process variations. © 2011 IEEE.Citation
Rabie, M., Bahgat, A., Ramadan, K., Shobak, H., Nasr, T., Abdelhafez, M., … Anis, M. (2011). A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. 2011 International Conference on Energy Aware Computing. doi:10.1109/iceac.2011.6136674Conference/Event name
2011 International Conference on Energy Aware Computing, ICEAC 2011ISBN
9781467304658ae974a485f413a2113503eed53cd6c53
10.1109/ICEAC.2011.6136674