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    AuthorMin, Jung-Wook (2)Ng, Tien Khee (2)Ooi, Boon S. (2)Prabaswara, Aditya (2)
    Zhao, Chao (2)
    View MoreDepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division (2)
    Electrical Engineering Program (2)
    Imaging and Characterization Core Lab (2)
    Photonics Laboratory (2)
    Electron Microscopy (1)View MoreJournalNanoscale Research Letters (2)KAUST Grant Number
    BAS/1/1614-01-01 (2)
    Publisher
    Springer Nature (2)
    SubjectNanowires (2)Amorphous quartz (1)Gallium Nitride (1)Gallium nitride (1)Indium Tin Oxide (1)View MoreType
    Article (2)
    Year (Issue Date)2019 (1)2018 (1)Item Availability
    Open Access (2)

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    Direct Growth of Single Crystalline GaN Nanowires on Indium Tin Oxide-Coated Silica

    Prabaswara, Aditya; Min, Jung-Wook; Subedi, Ram; Tangi, Malleswararao; Holguin Lerma, Jorge Alberto; Zhao, Chao; Priante, Davide; Ng, Tien Khee; Ooi, Boon S. (Nanoscale Research Letters, Springer Nature, 2019-02-05) [Article]
    In this work, we demonstrated the direct growth of GaN nanowires on indium tin oxide (ITO)-coated fused silica substrate. The nanowires were grown catalyst-free using plasma-assisted molecular beam epitaxy (PA-MBE). The effect of growth condition on the morphology and quality of the nanowires is systematically investigated. Structural characterization indicates that the nanowires grow in the (0001) direction directly on top of the ITO layer perpendicular to the substrate plane. Optical characterization of the nanowires shows that yellow luminescence is absent from the nanowire's photoluminescence response, attributed to the low number of defects. Conductive atomic force microscopy (C-AFM) measurement on n-doped GaN nanowires shows good conductivity for individual nanowires, which confirms the potential of using this platform for novel device applications. By using a relatively low-temperature growth process, we were able to successfully grow high-quality single-crystal GaN material without the degradation of the underlying ITO layer.
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    Direct Growth of III-Nitride Nanowire-Based Yellow Light-Emitting Diode on Amorphous Quartz Using Thin Ti Interlayer

    Prabaswara, Aditya; Min, Jung-Wook; Zhao, Chao; Janjua, Bilal; Zhang, Daliang; Albadri, Abdulrahman M.; Alyamani, Ahmed Y.; Ng, Tien Khee; Ooi, Boon S. (Nanoscale Research Letters, Springer Nature, 2018-02-06) [Article]
    Consumer electronics have increasingly relied on ultra-thin glass screen due to its transparency, scalability, and cost. In particular, display technology relies on integrating light-emitting diodes with display panel as a source for backlighting. In this study, we undertook the challenge of integrating light emitters onto amorphous quartz by demonstrating the direct growth and fabrication of a III-nitride nanowire-based light-emitting diode. The proof-of-concept device exhibits a low turn-on voltage of 2.6 V, on an amorphous quartz substrate. We achieved ~ 40% transparency across the visible wavelength while maintaining electrical conductivity by employing a TiN/Ti interlayer on quartz as a translucent conducting layer. The nanowire-on-quartz LED emits a broad linewidth spectrum of light centered at true yellow color (~ 590 nm), an important wavelength bridging the green-gap in solid-state lighting technology, with significantly less strain and dislocations compared to conventional planar quantum well nitride structures. Our endeavor highlighted the feasibility of fabricating III-nitride optoelectronic device on a scalable amorphous substrate through facile growth and fabrication steps. For practical demonstration, we demonstrated tunable correlated color temperature white light, leveraging on the broadly tunable nanowire spectral characteristics across red-amber-yellow color regime.
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