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    AuthorAlanazi, Lafi M. (1)Alhamoud, Abdullah (1)Alias, Mohd Sharizal (1)Alyamani, Ahmed (1)Janjua, Bilal (1)View MoreDepartment
    Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division (1)
    Electrical Engineering Program (1)
    Photonics Laboratory (1)JournalIEEE Photonics Journal (1)KAUST Grant Number
    BAS/1/1614-01-01 (1)
    Publisher
    Institute of Electrical and Electronics Engineers (IEEE) (1)
    SubjectLight-emitting diodes (LEDs) (1)nanowires (1)nitrides (1)quantum disks (1)ultraviolet (1)View MoreTypeArticle (1)Year (Issue Date)
    2018 (1)
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    Open Access (1)

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    Ultraviolet-A LED Based on Quantum-disks-in-AlGaN-nanowires - Optimization and Device Reliability

    Janjua, Bilal; Priante, Davide; Prabaswara, Aditya; Alanazi, Lafi M.; Zhao, Chao; Alhamoud, Abdullah; Alias, Mohd Sharizal; Rahman, Abdul; Alyamani, Ahmed; Ng, Tien Khee; Ooi, Boon S. (IEEE Photonics Journal, Institute of Electrical and Electronics Engineers (IEEE), 2018-03-16) [Article]
    Group-III nitride-based ultraviolet (UV) quantum-disks (Qdisks) nanowires (NWs) light-emitting diodes grown on silicon substrates offer a scalable, environment-friendly, compact, and low-cost solution for numerous applications such as solid-state lighting, spectroscopy, and biomedical. However, the internal quantum efficiency, injection efficiency, and extraction efficiency need to be further improved. The focus of this paper encompasses investigations based on structural optimization, device simulation, and device reliability. To optimize a UV-A (320-400 nm) device structure we utilize the self-assembled quantum-disk-NWs with varying quantum-disks thickness to study carrier separation in active-region and implement an improved p-contact-layer to increase output power. By simulation, we found a 100° improvement in the direct recombination rate for samples with thicker Qdisks thickness of 1.2 nm compared to the sample with 0.6 nm-thick Qdisks. Moreover, the sample with graded top Mg-doped AlGaN layer in conjunction with thin Mg-doped GaN layer shows 10° improvement in the output power compared to the samples with thicker top Mg-doped GaN absorbing contact layer. A fitting with ABC model revealed the increase in non-radiative recombination centers in the active region after a soft stress-test. This work aims to shed light on the research efforts required for furthering the UV NWs LED research for practical applications.
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