Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors
Type
ArticleAuthors
Wang, LeiMa, Yanwei
Wang, Qingxiao
Li, Kun
Zhang, Xixiang

Qi, Yanpeng
Gao, Zhaoshun
Zhang, Xianping
Wang, Dongliang
Yao, Chao
Wang, Chunlei
KAUST Department
Advanced Nanofabrication, Imaging and Characterization Core LabImaging and Characterization Core Lab
Material Science and Engineering Program
Physical Science and Engineering (PSE) Division
Date
2011-06-03Preprint Posting Date
2011-04-28Online Publication Date
2011-06-03Print Publication Date
2011-05-30Permanent link to this record
http://hdl.handle.net/10754/552804
Metadata
Show full item recordAbstract
We report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystallineSr0.6K0.4Fe2As2superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (Jc) of polycrystalline samples with respect to that of bicrystal films.Citation
Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors 2011, 98 (22):222504 Applied Physics LettersPublisher
AIP PublishingJournal
Applied Physics LettersarXiv
1104.5372Additional Links
http://scitation.aip.org/content/aip/journal/apl/98/22/10.1063/1.3592580http://arxiv.org/abs/1104.5372
ae974a485f413a2113503eed53cd6c53
10.1063/1.3592580