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dc.contributor.authorLi, Bodong
dc.contributor.authorKosel, Jürgen
dc.date.accessioned2015-05-14T07:16:16Z
dc.date.available2015-05-14T07:16:16Z
dc.date.issued2011-04-04
dc.identifier.citationThree dimensional simulation of giant magneto-impedance effect in thin film structures 2011, 109 (7):07E519 Journal of Applied Physics
dc.identifier.issn00218979
dc.identifier.doi10.1063/1.3556947
dc.identifier.urihttp://hdl.handle.net/10754/552783
dc.description.abstractIn this paper, a three dimensional model for the giant magneto-impedance (GMI) effect in thin film structures is developed using the finite element method(FEM) with a GMI permeability model embedded. One-layer, three-layer, and five-layer thin film structures are simulated. The GMI effect and the sensitivity are calculated as a function of the external magnetic field, driving frequency, and the thickness of the magnetic layers. The results show that the five-layer structure has the best performance, which is in accordance with experimental results. The GMI ratio and the sensitivity first improve with the increasing thickness of the magnetic layer but reach saturation at a certain value of the thickness. In a five-layer structure,saturation of the GMI effect becomes effective at about 3 μm thickness of the magnetic layers, where a GMI ratio of 1125% was obtained, with a corresponding sensitivity of 0.37%/A/m (29.6%/Oe).
dc.publisherAIP Publishing
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/jap/109/7/10.1063/1.3556947
dc.rightsArchived with thanks to Journal of Applied Physics
dc.titleThree dimensional simulation of giant magneto-impedance effect in thin film structures
dc.typeArticle
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentPhysical Science and Engineering (PSE) Division
dc.contributor.departmentSensing, Magnetism and Microsystems Lab
dc.identifier.journalJournal of Applied Physics
dc.eprint.versionPublisher's Version/PDF
kaust.personLi, Bodong
kaust.personKosel, Jürgen
refterms.dateFOA2018-06-14T06:17:35Z
dc.date.published-online2011-04-04
dc.date.published-print2011-04


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