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    Intrinsic nanofilamentation in resistive switching

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    Type
    Article
    Authors
    Wu, Xing
    Cha, Dong Kyu
    Bosman, Michel cc
    Raghavan, Nagarajan
    Migas, Dmitri B.
    Borisenko, Victor E.
    Zhang, Xixiang cc
    Li, Kun
    Pey, Kin-Leong
    KAUST Department
    Advanced Nanofabrication, Imaging and Characterization Core Lab
    Core Labs
    Imaging and Characterization Core Lab
    Material Science and Engineering Program
    Physical Science and Engineering (PSE) Division
    Date
    2013-03-16
    Online Publication Date
    2013-03-16
    Print Publication Date
    2013-03-21
    Permanent link to this record
    http://hdl.handle.net/10754/552547
    
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    Abstract
    Resistive switching materials are promising candidates for nonvolatile data storage and reconfiguration of electronic applications. Intensive studies have been carried out on sandwiched metal-insulator-metal structures to achieve high density on-chip circuitry and non-volatile memory storage. Here, we provide insight into the mechanisms that govern highly reproducible controlled resistive switching via a nanofilament by using an asymmetric metal-insulator-semiconductor structure. In-situ transmission electron microscopy is used to study in real-time the physical structure and analyze the chemical composition of the nanofilament dynamically during resistive switching. Electrical stressing using an external voltage was applied by a tungsten tip to the nanosized devices having hafnium oxide (HfO2) as the insulator layer. The formation and rupture of the nanofilaments result in up to three orders of magnitude change in the current flowing through the dielectric during the switching event. Oxygen vacancies and metal atoms from the anode constitute the chemistry of the nanofilament.
    Citation
    Intrinsic nanofilamentation in resistive switching 2013, 113 (11):114503 Journal of Applied Physics
    Publisher
    AIP Publishing
    Journal
    Journal of Applied Physics
    DOI
    10.1063/1.4794519
    Additional Links
    http://scitation.aip.org/content/aip/journal/jap/113/11/10.1063/1.4794519
    ae974a485f413a2113503eed53cd6c53
    10.1063/1.4794519
    Scopus Count
    Collections
    Articles; Imaging and Characterization Core Lab; Physical Science and Engineering (PSE) Division; Material Science and Engineering Program

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