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dc.contributor.authorGhoneim, Mohamed T.
dc.contributor.authorKutbee, Arwa T.
dc.contributor.authorGhodsi Nasseri, Seyed Faizelldin
dc.contributor.authorBersuker, G.
dc.contributor.authorHussain, Muhammad Mustafa
dc.date.accessioned2015-05-04T16:32:58Z
dc.date.available2015-05-04T16:32:58Z
dc.date.issued2014-06-09
dc.identifier.citationMechanical anomaly impact on metal-oxide-semiconductor capacitors on flexible silicon fabric 2014, 104 (23):234104 Applied Physics Letters
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.doi10.1063/1.4882647
dc.identifier.urihttp://hdl.handle.net/10754/552155
dc.description.abstractWe report the impact of mechanical anomaly on high-κ/metal-oxide-semiconductor capacitors built on flexible silicon (100) fabric. The mechanical tests include studying the effect of bending radius up to 5 mm minimum bending radius with respect to breakdown voltage and leakage current of the devices. We also report the effect of continuous mechanical stress on the breakdown voltage over extended periods of times.
dc.publisherAIP Publishing
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/apl/104/23/10.1063/1.4882647
dc.rightsArchived with thanks to Applied Physics Letters
dc.titleMechanical anomaly impact on metal-oxide-semiconductor capacitors on flexible silicon fabric
dc.typeArticle
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
dc.contributor.departmentElectrical Engineering Program
dc.contributor.departmentGraduate Development and Services
dc.contributor.departmentIntegrated Nanotechnology Lab
dc.contributor.departmentMaterial Science and Engineering Program
dc.contributor.departmentThe KAUST School
dc.identifier.journalApplied Physics Letters
dc.eprint.versionPublisher's Version/PDF
dc.contributor.institutionSEMATECH, 257 Fuller Road, Albany, New York 12203, USA
kaust.personGhoneim, Mohamed T.
kaust.personKutbee, Arwa T.
kaust.personHussain, Muhammad Mustafa
kaust.personGhodsi Nasseri, Seyed Faizelldin
refterms.dateFOA2015-06-10T00:00:00Z


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