Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry
KAUST DepartmentMaterial Science and Engineering Program
Physical Science and Engineering (PSE) Division
Permanent link to this recordhttp://hdl.handle.net/10754/346722
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AbstractSpectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
CitationOptical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry 2014, 105 (20):201905 Applied Physics Letters
JournalApplied Physics Letters