Integrated Cu-based TM-pass polarizer using CMOS technology platform
KAUST DepartmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division
Electrical Engineering Program
Physical Science and Engineering (PSE) Division
Permanent link to this recordhttp://hdl.handle.net/10754/310655
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AbstractA transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2-1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors' knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.
CitationTien KN, Zahed MK, Boon SO (2010) Integrated Cu-based TM-pass polarizer using CMOS technology platform. 2010 Photonics Global Conference. doi:10.1109/PGC.2010.5706134.
SponsorsKAUST - Academic Excellence Alliance (AEA) 2010 Grant
Journal2010 Photonics Global Conference
Conference/Event namePhotonics Global Conference (PGC), 2010