Integrated Cu-based TM-pass polarizer using CMOS technology platform
Type
Conference PaperKAUST Department
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) DivisionElectrical Engineering Program
Photonics Laboratory
Physical Science and Engineering (PSE) Division
Date
2010Permanent link to this record
http://hdl.handle.net/10754/310655
Metadata
Show full item recordAbstract
A transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2-1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors' knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.Citation
Tien KN, Zahed MK, Boon SO (2010) Integrated Cu-based TM-pass polarizer using CMOS technology platform. 2010 Photonics Global Conference. doi:10.1109/PGC.2010.5706134.Sponsors
KAUST - Academic Excellence Alliance (AEA) 2010 GrantJournal
2010 Photonics Global ConferenceConference/Event name
Photonics Global Conference (PGC), 2010ISBN
978-1-4244-9882-6ae974a485f413a2113503eed53cd6c53
10.1109/PGC.2010.5706134