Measurement of the surface susceptibility and the surface conductivity of atomically thin by spectroscopic ellipsometry

Handle URI:
http://hdl.handle.net/10754/626513
Title:
Measurement of the surface susceptibility and the surface conductivity of atomically thin by spectroscopic ellipsometry
Authors:
Jayaswal, Gaurav; Dai, Zhenyu; Zhang, Xixiang ( 0000-0002-3478-6414 ) ; Bagnarol, Mirko; Martucci, Alessandro; Merano, Michele
Abstract:
We show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer $\rm MoS_2$. Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Currently experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer $\rm MoS_2$, owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.
KAUST Department:
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Physical Sciences and Engineering (PSE) Division
Publisher:
arXiv
Issue Date:
1-Oct-2017
ARXIV:
arXiv:1710.00340
Type:
Preprint
Additional Links:
http://arxiv.org/abs/1710.00340v1; http://arxiv.org/pdf/1710.00340v1
Appears in Collections:
Other/General Submission; Physical Sciences and Engineering (PSE) Division; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorJayaswal, Gauraven
dc.contributor.authorDai, Zhenyuen
dc.contributor.authorZhang, Xixiangen
dc.contributor.authorBagnarol, Mirkoen
dc.contributor.authorMartucci, Alessandroen
dc.contributor.authorMerano, Micheleen
dc.date.accessioned2017-12-28T07:32:14Z-
dc.date.available2017-12-28T07:32:14Z-
dc.date.issued2017-10-01en
dc.identifier.urihttp://hdl.handle.net/10754/626513-
dc.description.abstractWe show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer $\rm MoS_2$. Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Currently experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer $\rm MoS_2$, owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.en
dc.publisherarXiven
dc.relation.urlhttp://arxiv.org/abs/1710.00340v1en
dc.relation.urlhttp://arxiv.org/pdf/1710.00340v1en
dc.rightsArchived with thanks to arXiven
dc.titleMeasurement of the surface susceptibility and the surface conductivity of atomically thin by spectroscopic ellipsometryen
dc.typePreprinten
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.eprint.versionPre-printen
dc.contributor.institutionDipartimento di Fisica e Astronomia G. Galilei, Universit`a degli studi di Padova, via Marzolo 8, 35131 Padova, Italyen
dc.contributor.institutionDipartimento di Ingegneria Industriale, Universit`a degli studi di Padova, via Marzolo 9, 35131 Padova, Italyen
dc.identifier.arxividarXiv:1710.00340en
kaust.authorJayaswal, Gauraven
kaust.authorDai, Zhenyuen
kaust.authorZhang, Xixiangen
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