Optimization of Monochromated TEM for Ultimate Resolution Imaging and Ultrahigh Resolution Electron Energy Loss Spectroscopy

Handle URI:
http://hdl.handle.net/10754/625753
Title:
Optimization of Monochromated TEM for Ultimate Resolution Imaging and Ultrahigh Resolution Electron Energy Loss Spectroscopy
Authors:
Lopatin, Sergei; Cheng, Bin; Liu, Wei-Ting; Tsai, Meng-Lin; He, Jr-Hau ( 0000-0003-1886-9241 ) ; Chuvilin, Andrey
Abstract:
The performance of a monochromated transmission electron microscope with Wien type monochromator is optimized to achieve an extremely narrow energy spread of electron beam and an ultrahigh energy resolution with spectroscopy. The energy spread in the beam is improved by almost an order of magnitude as compared to specified values. The optimization involves both the monochromator and the electron energy loss detection system. We demonstrate boosted capability of optimized systems with respect to ultra-low loss EELS and sub-angstrom resolution imaging (in a combination with spherical aberration correction).
KAUST Department:
Imaging and Characterization Core Lab; Computer, Elec, Math Sciences & Eng, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.
Citation:
Lopatin S, Cheng B, Liu W-T, Tsai M-L, He J-H, et al. (2018) Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy. Ultramicroscopy 184: 109–115. Available: http://dx.doi.org/10.1016/j.ultramic.2017.08.016.
Publisher:
Elsevier BV
Journal:
Ultramicroscopy
Issue Date:
1-Sep-2017
DOI:
10.1016/j.ultramic.2017.08.016
Type:
Article
ISSN:
0304-3991
Sponsors:
Authors would like to thank Dr. Peter C Tiemeijer from FEI Co for fruitful comments and discussions regarding the monochromator operation and optimization. Also we would like to acknowledge Dmitry Melnikau for providing a sample of Ag nanowires.
Additional Links:
http://www.sciencedirect.com/science/article/pii/S0304399117302073
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab

Full metadata record

DC FieldValue Language
dc.contributor.authorLopatin, Sergeien
dc.contributor.authorCheng, Binen
dc.contributor.authorLiu, Wei-Tingen
dc.contributor.authorTsai, Meng-Linen
dc.contributor.authorHe, Jr-Hauen
dc.contributor.authorChuvilin, Andreyen
dc.date.accessioned2017-10-03T12:49:37Z-
dc.date.available2017-10-03T12:49:37Z-
dc.date.issued2017-09-01en
dc.identifier.citationLopatin S, Cheng B, Liu W-T, Tsai M-L, He J-H, et al. (2018) Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopy. Ultramicroscopy 184: 109–115. Available: http://dx.doi.org/10.1016/j.ultramic.2017.08.016.en
dc.identifier.issn0304-3991en
dc.identifier.doi10.1016/j.ultramic.2017.08.016en
dc.identifier.urihttp://hdl.handle.net/10754/625753-
dc.description.abstractThe performance of a monochromated transmission electron microscope with Wien type monochromator is optimized to achieve an extremely narrow energy spread of electron beam and an ultrahigh energy resolution with spectroscopy. The energy spread in the beam is improved by almost an order of magnitude as compared to specified values. The optimization involves both the monochromator and the electron energy loss detection system. We demonstrate boosted capability of optimized systems with respect to ultra-low loss EELS and sub-angstrom resolution imaging (in a combination with spherical aberration correction).en
dc.description.sponsorshipAuthors would like to thank Dr. Peter C Tiemeijer from FEI Co for fruitful comments and discussions regarding the monochromator operation and optimization. Also we would like to acknowledge Dmitry Melnikau for providing a sample of Ag nanowires.en
dc.publisherElsevier BVen
dc.relation.urlhttp://www.sciencedirect.com/science/article/pii/S0304399117302073en
dc.rightsNOTICE: this is the author’s version of a work that was accepted for publication in Ultramicroscopy. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Ultramicroscopy, [, , (2017-09-01)] DOI: 10.1016/j.ultramic.2017.08.016 . © 2017. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/en
dc.subjectBandgapen
dc.subjectEELSen
dc.subjectPhononsen
dc.subjectPlasmonsen
dc.subjectSub-angstrom resolutionen
dc.subjectUltra-low energy lossen
dc.titleOptimization of Monochromated TEM for Ultimate Resolution Imaging and Ultrahigh Resolution Electron Energy Loss Spectroscopyen
dc.typeArticleen
dc.contributor.departmentImaging and Characterization Core Laben
dc.contributor.departmentComputer, Elec, Math Sciences & Eng, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.en
dc.identifier.journalUltramicroscopyen
dc.eprint.versionPost-printen
dc.contributor.institutionDepartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, , Taiwanen
dc.contributor.institutionIKERBASQUE, Basque Foundation for Science, Bilbao, , Spainen
dc.contributor.institutionCIC nanoGUNE Consolider, San Sebastian, Spainen
kaust.authorLopatin, Sergeien
kaust.authorCheng, Binen
kaust.authorLiu, Wei-Tingen
kaust.authorHe, Jr-Hauen
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