Guest Editorial Special Issue on Extreme Imaging

Handle URI:
http://hdl.handle.net/10754/625723
Title:
Guest Editorial Special Issue on Extreme Imaging
Authors:
Freeman, W. T. ( 0000-0002-2231-7995 ) ; Savakis, A.; Schechner, Y.; Snavely, N.; Heidrich, Wolfgang ( 0000-0002-4227-8508 )
KAUST Department:
Visual Computing Center (VCC)
Citation:
Freeman WT, Savakis A, Schechner Y, Snavely N, Heidrich W (2017) Guest Editorial Special Issue on Extreme Imaging. IEEE Transactions on Computational Imaging 3: 382–383. Available: http://dx.doi.org/10.1109/tci.2017.2726838.
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
IEEE Transactions on Computational Imaging
Issue Date:
7-Aug-2017
DOI:
10.1109/tci.2017.2726838
Type:
Article
ISSN:
2333-9403; 2334-0118
Sponsors:
The guest editors are grateful to the EIC Prof. William Clem Karl who was extremely supportive of this special issue and provided guidance throughout the process. The guest editors would like to thank the authors who contributed to this special issue and the reviewers who helped improve the manuscripts with their constructive comments and suggestions. The guest editors are thankful to Adrienne Fisher, IEEE publications coordinator, who provided support at every step of the review process. We hope that this special issue increases interest in extreme imaging and stimulates research in the field and the organization of future workshops and special issues.
Additional Links:
http://ieeexplore.ieee.org/document/8003563/
Appears in Collections:
Articles; Visual Computing Center (VCC)

Full metadata record

DC FieldValue Language
dc.contributor.authorFreeman, W. T.en
dc.contributor.authorSavakis, A.en
dc.contributor.authorSchechner, Y.en
dc.contributor.authorSnavely, N.en
dc.contributor.authorHeidrich, Wolfgangen
dc.date.accessioned2017-10-03T12:49:36Z-
dc.date.available2017-10-03T12:49:36Z-
dc.date.issued2017-08-07en
dc.identifier.citationFreeman WT, Savakis A, Schechner Y, Snavely N, Heidrich W (2017) Guest Editorial Special Issue on Extreme Imaging. IEEE Transactions on Computational Imaging 3: 382–383. Available: http://dx.doi.org/10.1109/tci.2017.2726838.en
dc.identifier.issn2333-9403en
dc.identifier.issn2334-0118en
dc.identifier.doi10.1109/tci.2017.2726838en
dc.identifier.urihttp://hdl.handle.net/10754/625723-
dc.description.sponsorshipThe guest editors are grateful to the EIC Prof. William Clem Karl who was extremely supportive of this special issue and provided guidance throughout the process. The guest editors would like to thank the authors who contributed to this special issue and the reviewers who helped improve the manuscripts with their constructive comments and suggestions. The guest editors are thankful to Adrienne Fisher, IEEE publications coordinator, who provided support at every step of the review process. We hope that this special issue increases interest in extreme imaging and stimulates research in the field and the organization of future workshops and special issues.en
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.urlhttp://ieeexplore.ieee.org/document/8003563/en
dc.titleGuest Editorial Special Issue on Extreme Imagingen
dc.typeArticleen
dc.contributor.departmentVisual Computing Center (VCC)en
dc.identifier.journalIEEE Transactions on Computational Imagingen
dc.contributor.institutionGoogle Research and Computer Science and Artificial Intelligence Laboratory Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology Cambridge, MA, USAen
dc.contributor.institutionDepartment of Computer Engineering Rochester Institute of Technology Rochester, NY, USAen
dc.contributor.institutionViterbi Faculty of Electrical Engineering Technion-Israel Institute of Technology Haifa, Israelen
dc.contributor.institutionGoogle Research and Department of Computer Science Cornell Tech Cornell University, New York, NY, USAen
kaust.authorHeidrich, Wolfgangen
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