Enhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatment

Handle URI:
http://hdl.handle.net/10754/625416
Title:
Enhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatment
Authors:
Jang, Ji-Wook; Friedrich, Dennis; Müller, Sönke; Lamers, Marlene; Hempel, Hannes; Lardhi, Sheikha F. ( 0000-0001-9061-8397 ) ; Cao, Zhen; Harb, Moussab ( 0000-0001-5540-9792 ) ; Cavallo, Luigi ( 0000-0002-1398-338X ) ; Heller, René; Eichberger, Rainer; van de Krol, Roel ( 0000-0003-4399-399X ) ; Abdi, Fatwa F. ( 0000-0001-5631-0620 )
Abstract:
Widespread application of solar water splitting for energy conversion is largely dependent on the progress in developing not only efficient but also cheap and scalable photoelectrodes. Metal oxides, which can be deposited with scalable techniques and are relatively cheap, are particularly interesting, but high efficiency is still hindered by the poor carrier transport properties (i.e., carrier mobility and lifetime). Here, a mild hydrogen treatment is introduced to bismuth vanadate (BiVO4), which is one of the most promising metal oxide photoelectrodes, as a method to overcome the carrier transport limitations. Time-resolved microwave and terahertz conductivity measurements reveal more than twofold enhancement of the carrier lifetime for the hydrogen-treated BiVO4, without significantly affecting the carrier mobility. This is in contrast to the case of tungsten-doped BiVO4, although hydrogen is also a donor type dopant in BiVO4. The enhancement in carrier lifetime is found to be caused by significant reduction of trap-assisted recombination, either via passivation or reduction of deep trap states related to vanadium antisite on bismuth or vanadium interstitials according to density functional theory calculations. Overall, these findings provide further insights on the interplay between defect modulation and carrier transport in metal oxides, which benefit the development of low-cost, highly-efficient solar energy conversion devices.
KAUST Department:
KAUST Catalysis Center (KCC); Physical Sciences and Engineering (PSE) Division
Citation:
Jang J-W, Friedrich D, Müller S, Lamers M, Hempel H, et al. (2017) Enhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatment. Advanced Energy Materials: 1701536. Available: http://dx.doi.org/10.1002/aenm.201701536.
Publisher:
Wiley-Blackwell
Journal:
Advanced Energy Materials
Issue Date:
25-Aug-2017
DOI:
10.1002/aenm.201701536
Type:
Article
ISSN:
1614-6832
Sponsors:
This research was supported by the PECDEMO project (cofunded by Europe's Fuel Cell and Hydrogen Joint Undertaking under Grant Agreement no. 621252) and the German Bundesministerium für Bildung und Forschung (BMBF), project “MeOx4H2” (03SF0478A). Parts of this research were carried out at IBC at Helmholtz-Zentrum Dresden-Rossendorf e.V., a member of the Helmholtz Association. The authors thank Dr. Klaus Ellmer and Karsten Harbauer for the assistance in the electrical conductivity measurements.
Additional Links:
http://onlinelibrary.wiley.com/doi/10.1002/aenm.201701536/abstract
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division; KAUST Catalysis Center (KCC)

Full metadata record

DC FieldValue Language
dc.contributor.authorJang, Ji-Wooken
dc.contributor.authorFriedrich, Dennisen
dc.contributor.authorMüller, Sönkeen
dc.contributor.authorLamers, Marleneen
dc.contributor.authorHempel, Hannesen
dc.contributor.authorLardhi, Sheikha F.en
dc.contributor.authorCao, Zhenen
dc.contributor.authorHarb, Moussaben
dc.contributor.authorCavallo, Luigien
dc.contributor.authorHeller, Renéen
dc.contributor.authorEichberger, Raineren
dc.contributor.authorvan de Krol, Roelen
dc.contributor.authorAbdi, Fatwa F.en
dc.date.accessioned2017-08-29T12:47:48Z-
dc.date.available2017-08-29T12:47:48Z-
dc.date.issued2017-08-25en
dc.identifier.citationJang J-W, Friedrich D, Müller S, Lamers M, Hempel H, et al. (2017) Enhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatment. Advanced Energy Materials: 1701536. Available: http://dx.doi.org/10.1002/aenm.201701536.en
dc.identifier.issn1614-6832en
dc.identifier.doi10.1002/aenm.201701536en
dc.identifier.urihttp://hdl.handle.net/10754/625416-
dc.description.abstractWidespread application of solar water splitting for energy conversion is largely dependent on the progress in developing not only efficient but also cheap and scalable photoelectrodes. Metal oxides, which can be deposited with scalable techniques and are relatively cheap, are particularly interesting, but high efficiency is still hindered by the poor carrier transport properties (i.e., carrier mobility and lifetime). Here, a mild hydrogen treatment is introduced to bismuth vanadate (BiVO4), which is one of the most promising metal oxide photoelectrodes, as a method to overcome the carrier transport limitations. Time-resolved microwave and terahertz conductivity measurements reveal more than twofold enhancement of the carrier lifetime for the hydrogen-treated BiVO4, without significantly affecting the carrier mobility. This is in contrast to the case of tungsten-doped BiVO4, although hydrogen is also a donor type dopant in BiVO4. The enhancement in carrier lifetime is found to be caused by significant reduction of trap-assisted recombination, either via passivation or reduction of deep trap states related to vanadium antisite on bismuth or vanadium interstitials according to density functional theory calculations. Overall, these findings provide further insights on the interplay between defect modulation and carrier transport in metal oxides, which benefit the development of low-cost, highly-efficient solar energy conversion devices.en
dc.description.sponsorshipThis research was supported by the PECDEMO project (cofunded by Europe's Fuel Cell and Hydrogen Joint Undertaking under Grant Agreement no. 621252) and the German Bundesministerium für Bildung und Forschung (BMBF), project “MeOx4H2” (03SF0478A). Parts of this research were carried out at IBC at Helmholtz-Zentrum Dresden-Rossendorf e.V., a member of the Helmholtz Association. The authors thank Dr. Klaus Ellmer and Karsten Harbauer for the assistance in the electrical conductivity measurements.en
dc.publisherWiley-Blackwellen
dc.relation.urlhttp://onlinelibrary.wiley.com/doi/10.1002/aenm.201701536/abstracten
dc.titleEnhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatmenten
dc.typeArticleen
dc.contributor.departmentKAUST Catalysis Center (KCC)en
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalAdvanced Energy Materialsen
dc.contributor.institutionInstitute for Solar Fuels; Helmholtz-Zentrum Berlin für Materialien und Energie GmbH; Hahn-Meitner-Platz 1 Berlin 14109 Germanyen
dc.contributor.institutionDepartment of Structure and Dynamics of Energy Materials; Helmholtz-Zentrum Berlin für Materialien und Energie GmbH; Hahn-Meitner-Platz 1 Berlin 14109 Germanyen
dc.contributor.institutionInstitute of Ion Beam Physics and Materials Research; Helmholtz-Zentrum Dresden-Rossendorf; Dresden 01328 Germanyen
kaust.authorLardhi, Sheikha F.en
kaust.authorCao, Zhenen
kaust.authorHarb, Moussaben
kaust.authorCavallo, Luigien
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