Characterization of T8 Tempered Al-Li-Cu alloy (AA2195) by Using AC- STEM

Handle URI:
http://hdl.handle.net/10754/623222
Title:
Characterization of T8 Tempered Al-Li-Cu alloy (AA2195) by Using AC- STEM
Authors:
Anjum, Dalaver H.; Khushaim, Muna; Leseman, Zayd C.
KAUST Department:
Imaging and Characterization Core Lab
Citation:
Anjum DH, Khushaim M, Leseman ZC (2016) Characterization of T8 Tempered Al-Li-Cu alloy (AA2195) by Using AC- STEM. Microscopy and Microanalysis 22: 1946–1947. Available: http://dx.doi.org/10.1017/s1431927616010576.
Publisher:
Cambridge University Press (CUP)
Journal:
Microscopy and Microanalysis
Issue Date:
8-Dec-2016
DOI:
10.1017/s1431927616010576
Type:
Article
ISSN:
1431-9276; 1435-8115
Additional Links:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/div-classtitlecharacterization-of-t8-tempered-al-li-cu-alloy-aa2195-by-using-ac-stemdiv/09A426F24CFC29D88ADDEF98556F1DE1
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab

Full metadata record

DC FieldValue Language
dc.contributor.authorAnjum, Dalaver H.en
dc.contributor.authorKhushaim, Munaen
dc.contributor.authorLeseman, Zayd C.en
dc.date.accessioned2017-04-15T11:15:45Z-
dc.date.available2017-04-15T11:15:45Z-
dc.date.issued2016-12-08en
dc.identifier.citationAnjum DH, Khushaim M, Leseman ZC (2016) Characterization of T8 Tempered Al-Li-Cu alloy (AA2195) by Using AC- STEM. Microscopy and Microanalysis 22: 1946–1947. Available: http://dx.doi.org/10.1017/s1431927616010576.en
dc.identifier.issn1431-9276en
dc.identifier.issn1435-8115en
dc.identifier.doi10.1017/s1431927616010576en
dc.identifier.urihttp://hdl.handle.net/10754/623222-
dc.publisherCambridge University Press (CUP)en
dc.relation.urlhttps://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/div-classtitlecharacterization-of-t8-tempered-al-li-cu-alloy-aa2195-by-using-ac-stemdiv/09A426F24CFC29D88ADDEF98556F1DE1en
dc.titleCharacterization of T8 Tempered Al-Li-Cu alloy (AA2195) by Using AC- STEMen
dc.typeArticleen
dc.contributor.departmentImaging and Characterization Core Laben
dc.identifier.journalMicroscopy and Microanalysisen
dc.contributor.institutionDepartment of Physics, Taibah University, PO Box 344, Medina, Kingdom of Saudi Arabiaen
dc.contributor.institutionDepartment of Mechanical Engineering, University of New Mexico, Albuquerque, NMen
kaust.authorAnjum, Dalaver H.en
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