Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System

Handle URI:
http://hdl.handle.net/10754/623201
Title:
Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System
Authors:
Bera, Tushar Kanti; Bera, Sampa; Nagaraju, J; Chakraborty, Badal
KAUST Department:
King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia
Citation:
Bera T, Bera S, Nagaraju J, Chakraborty B (2017) Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System. Computer, Communication and Electrical Technology: 273–277. Available: http://dx.doi.org/10.1201/9781315400624-53.
Publisher:
Informa UK Limited
Journal:
Computer, Communication and Electrical Technology
Issue Date:
2-Mar-2017
DOI:
10.1201/9781315400624-53
Type:
Book Chapter
Additional Links:
http://www.crcnetbase.com/doi/10.1201/9781315400624-53
Appears in Collections:
Book Chapters

Full metadata record

DC FieldValue Language
dc.contributor.authorBera, Tushar Kantien
dc.contributor.authorBera, Sampaen
dc.contributor.authorNagaraju, Jen
dc.contributor.authorChakraborty, Badalen
dc.date.accessioned2017-04-13T11:51:00Z-
dc.date.available2017-04-13T11:51:00Z-
dc.date.issued2017-03-02en
dc.identifier.citationBera T, Bera S, Nagaraju J, Chakraborty B (2017) Multiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) System. Computer, Communication and Electrical Technology: 273–277. Available: http://dx.doi.org/10.1201/9781315400624-53.en
dc.identifier.doi10.1201/9781315400624-53en
dc.identifier.urihttp://hdl.handle.net/10754/623201-
dc.publisherInforma UK Limiteden
dc.relation.urlhttp://www.crcnetbase.com/doi/10.1201/9781315400624-53en
dc.titleMultiple inhomogeneity phantom imaging with a LabVIEW-based Electrical Impedance Tomography (LV-EIT) Systemen
dc.typeBook Chapteren
dc.contributor.departmentKing Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabiaen
dc.identifier.journalComputer, Communication and Electrical Technologyen
dc.contributor.institutionIndian Institute of Science (IISc), Bangalore, Indiaen
dc.contributor.institutionFaculty of Agricultural Engineering, Bidhan Chandra Krishi Viswavidyalaya, Mohanpur, West Bengal, Indiaen
kaust.authorBera, Tushar Kantien
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