Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Handle URI:
http://hdl.handle.net/10754/622801
Title:
Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale
Authors:
Kumar, Naresh; Zoladek-Lemanczyk, Alina; Guilbert, Anne A. Y.; Su, Weitao; Tuladhar, Sachetan M.; Kirchartz, Thomas; Schroeder, Bob C.; McCulloch, Iain ( 0000-0002-6340-7217 ) ; Nelson, Jenny; Roy, Debdulal; Castro, Fernando A.
Abstract:
Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with <20 nm spatial resolution by combining plasmonic optical signal enhancement with electrical-mode scanning probe microscopy. We demonstrate that this combined approach offers subsurface sensitivity that can be exploited to provide molecular information with a nanoscale resolution in all three spatial dimensions. By applying the technique to an organic solar cell device, we show that the inferred surface and subsurface composition distribution correlates strongly with the local photocurrent generation and explains macroscopic device performance. For instance, the direct measurement of fullerene phase purity can distinguish between high purity aggregates that lead to poor performance and lower purity aggregates (fullerene intercalated with polymer) that result in strong photocurrent generation and collection. We show that the reliable determination of the structure-property relationship at the nanoscale can remove ambiguity from macroscopic device data and support the identification of the best routes for device optimisation. The multi-parameter measurement approach demonstrated herein is expected to play a significant role in guiding the rational design of nanomaterial-based optoelectronic devices, by opening a new realm of possibilities for advanced investigation via the combination of nanoscale optical spectroscopy with a whole range of scanning probe microscopy modes.
KAUST Department:
Chemical Science Program
Citation:
Kumar N, Zoladek-Lemanczyk A, Guilbert AAY, Su W, Tuladhar SM, et al. (2017) Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale. Nanoscale. Available: http://dx.doi.org/10.1039/c6nr09057e.
Publisher:
Royal Society of Chemistry (RSC)
Journal:
Nanoscale
Issue Date:
12-Jan-2017
DOI:
10.1039/c6nr09057e
Type:
Article
ISSN:
2040-3364; 2040-3372
Sponsors:
The authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.
Additional Links:
http://pubs.rsc.org/en/Content/ArticleLanding/2017/NR/C6NR09057E#!divAbstract
Appears in Collections:
Articles; Chemical Science Program

Full metadata record

DC FieldValue Language
dc.contributor.authorKumar, Nareshen
dc.contributor.authorZoladek-Lemanczyk, Alinaen
dc.contributor.authorGuilbert, Anne A. Y.en
dc.contributor.authorSu, Weitaoen
dc.contributor.authorTuladhar, Sachetan M.en
dc.contributor.authorKirchartz, Thomasen
dc.contributor.authorSchroeder, Bob C.en
dc.contributor.authorMcCulloch, Iainen
dc.contributor.authorNelson, Jennyen
dc.contributor.authorRoy, Debdulalen
dc.contributor.authorCastro, Fernando A.en
dc.date.accessioned2017-01-29T13:51:40Z-
dc.date.available2017-01-29T13:51:40Z-
dc.date.issued2017-01-12en
dc.identifier.citationKumar N, Zoladek-Lemanczyk A, Guilbert AAY, Su W, Tuladhar SM, et al. (2017) Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale. Nanoscale. Available: http://dx.doi.org/10.1039/c6nr09057e.en
dc.identifier.issn2040-3364en
dc.identifier.issn2040-3372en
dc.identifier.doi10.1039/c6nr09057een
dc.identifier.urihttp://hdl.handle.net/10754/622801-
dc.description.abstractNovel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with <20 nm spatial resolution by combining plasmonic optical signal enhancement with electrical-mode scanning probe microscopy. We demonstrate that this combined approach offers subsurface sensitivity that can be exploited to provide molecular information with a nanoscale resolution in all three spatial dimensions. By applying the technique to an organic solar cell device, we show that the inferred surface and subsurface composition distribution correlates strongly with the local photocurrent generation and explains macroscopic device performance. For instance, the direct measurement of fullerene phase purity can distinguish between high purity aggregates that lead to poor performance and lower purity aggregates (fullerene intercalated with polymer) that result in strong photocurrent generation and collection. We show that the reliable determination of the structure-property relationship at the nanoscale can remove ambiguity from macroscopic device data and support the identification of the best routes for device optimisation. The multi-parameter measurement approach demonstrated herein is expected to play a significant role in guiding the rational design of nanomaterial-based optoelectronic devices, by opening a new realm of possibilities for advanced investigation via the combination of nanoscale optical spectroscopy with a whole range of scanning probe microscopy modes.en
dc.description.sponsorshipThe authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.en
dc.publisherRoyal Society of Chemistry (RSC)en
dc.relation.urlhttp://pubs.rsc.org/en/Content/ArticleLanding/2017/NR/C6NR09057E#!divAbstracten
dc.titleSimultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscaleen
dc.typeArticleen
dc.contributor.departmentChemical Science Programen
dc.identifier.journalNanoscaleen
dc.contributor.institutionNational Physical Laboratory, Teddington, Middlesex, UK TW11 0LW. naresh.kumar@npl.co.uk fernando.castro@npl.co.uk.en
dc.contributor.institutionDepartment of Physics, Imperial College London, London, UK SW7 2AZ.en
dc.contributor.institutionCollege of Materials and Environmental Engineering, Hangzou Dianzi University, 310018 Hangzou, China.en
dc.contributor.institutionDepartment of Physics, Imperial College London, London, UK SW7 2AZ and IEK-5 Photovoltaik, Forschungzentrum Juelich, 52425, Juelich, Germany and Faculty of Engineering and CENIDE, University of Duisburg-Essen, Carl-Benz-Strasse 199, 47057 Duisburg, Germany.en
dc.contributor.institutionDepartment of Chemistry, Imperial College London, London, UK SW7 2AZ.en
kaust.authorMcCulloch, Iainen
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