Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique

Handle URI:
http://hdl.handle.net/10754/622779
Title:
Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique
Authors:
Adhikari, Aniruddha ( 0000-0003-1189-9755 ) ; Eliason, Jeffrey K.; Sun, Jingya; Bose, Riya; Flannigan, David J. ( 0000-0002-1829-1868 ) ; Mohammed, Omar F. ( 0000-0001-8500-1130 )
Abstract:
Four-dimensional ultrafast electron microscopy (4D-UEM) is a novel analytical technique that aims to fulfill the long-held dream of researchers to investigate materials at extremely short spatial and temporal resolutions by integrating the excellent spatial resolution of electron microscopes with the temporal resolution of ultrafast femtosecond laser-based spectroscopy. The ingenious use of pulsed photoelectrons to probe surfaces and volumes of materials enables time-resolved snapshots of the dynamics to be captured in a way hitherto impossible by other conventional techniques. The flexibility of 4D-UEM lies in the fact that it can be used in both the scanning (S-UEM) and transmission (UEM) modes depending upon the type of electron microscope involved. While UEM can be employed to monitor elementary structural changes and phase transitions in samples using real-space mapping, diffraction, electron energy-loss spectroscopy, and tomography, S-UEM is well suited to map ultrafast dynamical events on materials surfaces in space and time. This review provides an overview of the unique features that distinguish these techniques and also illustrates the applications of both S-UEM and UEM to a multitude of problems relevant to materials science and chemistry.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Citation:
Adhikari A, Eliason JK, Sun J, Bose R, Flannigan DJ, et al. (2017) Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique. ACS Applied Materials & Interfaces 9: 3–16. Available: http://dx.doi.org/10.1021/acsami.6b12301.
Publisher:
American Chemical Society (ACS)
Journal:
ACS Applied Materials & Interfaces
Issue Date:
15-Dec-2016
DOI:
10.1021/acsami.6b12301
Type:
Article
ISSN:
1944-8244; 1944-8252
Sponsors:
The work was supported by the King Abdullah University of Science and Technology. Funding for work conducted at the University of Minnesota was provided by the Arnold and Mabel Beckman Foundation in the form of a Beckman Young Investigator Award.
Additional Links:
http://pubs.acs.org/doi/full/10.1021/acsami.6b12301
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorAdhikari, Aniruddhaen
dc.contributor.authorEliason, Jeffrey K.en
dc.contributor.authorSun, Jingyaen
dc.contributor.authorBose, Riyaen
dc.contributor.authorFlannigan, David J.en
dc.contributor.authorMohammed, Omar F.en
dc.date.accessioned2017-01-29T13:51:38Z-
dc.date.available2017-01-29T13:51:38Z-
dc.date.issued2016-12-15en
dc.identifier.citationAdhikari A, Eliason JK, Sun J, Bose R, Flannigan DJ, et al. (2017) Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique. ACS Applied Materials & Interfaces 9: 3–16. Available: http://dx.doi.org/10.1021/acsami.6b12301.en
dc.identifier.issn1944-8244en
dc.identifier.issn1944-8252en
dc.identifier.doi10.1021/acsami.6b12301en
dc.identifier.urihttp://hdl.handle.net/10754/622779-
dc.description.abstractFour-dimensional ultrafast electron microscopy (4D-UEM) is a novel analytical technique that aims to fulfill the long-held dream of researchers to investigate materials at extremely short spatial and temporal resolutions by integrating the excellent spatial resolution of electron microscopes with the temporal resolution of ultrafast femtosecond laser-based spectroscopy. The ingenious use of pulsed photoelectrons to probe surfaces and volumes of materials enables time-resolved snapshots of the dynamics to be captured in a way hitherto impossible by other conventional techniques. The flexibility of 4D-UEM lies in the fact that it can be used in both the scanning (S-UEM) and transmission (UEM) modes depending upon the type of electron microscope involved. While UEM can be employed to monitor elementary structural changes and phase transitions in samples using real-space mapping, diffraction, electron energy-loss spectroscopy, and tomography, S-UEM is well suited to map ultrafast dynamical events on materials surfaces in space and time. This review provides an overview of the unique features that distinguish these techniques and also illustrates the applications of both S-UEM and UEM to a multitude of problems relevant to materials science and chemistry.en
dc.description.sponsorshipThe work was supported by the King Abdullah University of Science and Technology. Funding for work conducted at the University of Minnesota was provided by the Arnold and Mabel Beckman Foundation in the form of a Beckman Young Investigator Award.en
dc.publisherAmerican Chemical Society (ACS)en
dc.relation.urlhttp://pubs.acs.org/doi/full/10.1021/acsami.6b12301en
dc.subjectAtomic Resolutionen
dc.subjectSurface Dynamicsen
dc.subjectCharge Carrier Dynamicsen
dc.subjectElectron Impact Dynamicsen
dc.subject4D Ultrafast Electron Microscopyen
dc.subjectEnergy Loss Mechanismen
dc.titleFour-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Techniqueen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalACS Applied Materials & Interfacesen
dc.contributor.institutionDepartment of Chemical Engineering and Materials Science, University of Minnesota , 421 Washington Avenue SE, Minneapolis, Minnesota 55455, United States.en
kaust.authorAdhikari, Aniruddhaen
kaust.authorSun, Jingyaen
kaust.authorBose, Riyaen
kaust.authorMohammed, Omar F.en
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