X-ray diffraction imaging of material microstructures

Handle URI:
http://hdl.handle.net/10754/621826
Title:
X-ray diffraction imaging of material microstructures
Authors:
Varga, Laszlo; Varga, Bonbien; Calo, Victor
Assignee:
King Abdullah University Of Science And Technology
Abstract:
Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.
KAUST Department:
Physical Science and Engineering Division
Issue Date:
20-Oct-2016
Submitted date:
2015-04-16
Type:
Patent
Application Number:
WO 2016166704 A1
Patent Status:
Published Application
Additional Links:
http://www.google.com/patents/WO2016166704A1; http://worldwide.espacenet.com/publicationDetails/biblio?CC=WO&NR=2016166704A1&KC=A1&FT=D
Appears in Collections:
Patents

Full metadata record

DC FieldValue Language
dc.contributor.authorVarga, Laszloen
dc.contributor.authorVarga, Bonbienen
dc.contributor.authorCalo, Victoren
dc.date.accessioned2016-11-17T07:44:41Z-
dc.date.available2016-11-17T07:44:41Z-
dc.date.issued2016-10-20-
dc.date.submitted2015-04-16-
dc.identifier.urihttp://hdl.handle.net/10754/621826-
dc.description.abstractVarious examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.en
dc.relation.urlhttp://www.google.com/patents/WO2016166704A1en
dc.relation.urlhttp://worldwide.espacenet.com/publicationDetails/biblio?CC=WO&NR=2016166704A1&KC=A1&FT=Den
dc.titleX-ray diffraction imaging of material microstructuresen
dc.typePatenten
dc.contributor.departmentPhysical Science and Engineering Divisionen
dc.description.statusPublished Applicationen
dc.contributor.assigneeKing Abdullah University Of Science And Technologyen
dc.description.countryWorld Intellectual Property Organization (WIPO)en
dc.identifier.applicationnumberWO 2016166704 A1en
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