Analytical study of the frequency shifts of micro and nano clamped–clamped beam resonators due to an added mass

Handle URI:
http://hdl.handle.net/10754/621530
Title:
Analytical study of the frequency shifts of micro and nano clamped–clamped beam resonators due to an added mass
Authors:
Bouchaala, Adam M.; Nayfeh, Ali H.; Younis, Mohammad I. ( 0000-0002-9491-1838 )
Abstract:
We present analytical formulations to calculate the induced resonance frequency shifts of electrically actuated clamped–clamped micro and nano (Carbon nanotube) beams due to an added mass. Based on the Euler–Bernoulli beam theory, we investigate the linear dynamic responses of the beams added masses, which are modeled as discrete point masses. Analytical expressions based on perturbation techniques and a one-mode Galerkin approximation are developed to calculate accurately the frequency shifts under a DC voltage as a function of the added mass and position. The analytical results are compared to numerical solution of the eigenvalue problem. Results are shown for the fundamental as well as the higher-order modes of the beams. The results indicate a significant increase in the frequency shift, and hence the sensitivity of detection, when scaling down to nano scale and using higher-order modes. © 2016 Springer Science+Business Media Dordrecht
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Citation:
Bouchaala A, Nayfeh AH, Younis MI (2016) Analytical study of the frequency shifts of micro and nano clamped–clamped beam resonators due to an added mass. Meccanica. Available: http://dx.doi.org/10.1007/s11012-016-0412-4.
Publisher:
Springer Science + Business Media
Journal:
Meccanica
Issue Date:
18-Mar-2016
DOI:
10.1007/s11012-016-0412-4
Type:
Article
ISSN:
0025-6455; 1572-9648
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorBouchaala, Adam M.en
dc.contributor.authorNayfeh, Ali H.en
dc.contributor.authorYounis, Mohammad I.en
dc.date.accessioned2016-11-03T08:31:31Z-
dc.date.available2016-11-03T08:31:31Z-
dc.date.issued2016-03-18en
dc.identifier.citationBouchaala A, Nayfeh AH, Younis MI (2016) Analytical study of the frequency shifts of micro and nano clamped–clamped beam resonators due to an added mass. Meccanica. Available: http://dx.doi.org/10.1007/s11012-016-0412-4.en
dc.identifier.issn0025-6455en
dc.identifier.issn1572-9648en
dc.identifier.doi10.1007/s11012-016-0412-4en
dc.identifier.urihttp://hdl.handle.net/10754/621530-
dc.description.abstractWe present analytical formulations to calculate the induced resonance frequency shifts of electrically actuated clamped–clamped micro and nano (Carbon nanotube) beams due to an added mass. Based on the Euler–Bernoulli beam theory, we investigate the linear dynamic responses of the beams added masses, which are modeled as discrete point masses. Analytical expressions based on perturbation techniques and a one-mode Galerkin approximation are developed to calculate accurately the frequency shifts under a DC voltage as a function of the added mass and position. The analytical results are compared to numerical solution of the eigenvalue problem. Results are shown for the fundamental as well as the higher-order modes of the beams. The results indicate a significant increase in the frequency shift, and hence the sensitivity of detection, when scaling down to nano scale and using higher-order modes. © 2016 Springer Science+Business Media Dordrechten
dc.publisherSpringer Science + Business Mediaen
dc.subjectAdded massen
dc.subjectCarbon nanotubesen
dc.subjectFrequency shiften
dc.subjectGalerkin methodsen
dc.subjectMicro/nano beamsen
dc.subjectPerturbation techniquesen
dc.titleAnalytical study of the frequency shifts of micro and nano clamped–clamped beam resonators due to an added massen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalMeccanicaen
dc.contributor.institutionDepartment of Engineering Science and Mechanics, MC 0219, Virginia Polytechnic Institute and State University, Blacksburg, VA, United Statesen
dc.contributor.institutionDepartment of Mechanical Engineering, University of Jordan, Amman, Jordanen
kaust.authorBouchaala, Adam M.en
kaust.authorYounis, Mohammad I.en
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