Characterization of nanomaterials with transmission electron microscopy

Handle URI:
http://hdl.handle.net/10754/621085
Title:
Characterization of nanomaterials with transmission electron microscopy
Authors:
Anjum, Dalaver H.
Abstract:
The field of nanotechnology is about research and development on materials whose at least one dimension is in the range of 1 to 100 nanometers. In recent years, the research activity for developing nano-materials has grown exponentially owing to the fact that they offer better solutions to the challenges faced by various fields such as energy, food, and environment. In this paper, the importance of transmission electron microscopy (TEM) based techniques is demonstrated for investigating the properties of nano-materials. Specifically the nano-materials that are investigated in this report include gold nano-particles (Au-NPs), silver atom-clusters (Ag-ACs), tantalum single-atoms (Ta-SAs), carbon materials functionalized with iron cobalt (Fe-Co) NPs and titania (TiO2) NPs, and platinum loaded Ceria (Pt-CeO2) Nano composite. TEM techniques that are employed to investigate nano-materials include aberration corrected bright-field TEM (BF-TEM), high-angle dark-field scanning TEM (HAADF-STEM), electron energy-loss spectroscopy (EELS), and BF-TEM electron tomography (ET). With the help presented of results in this report, it is proved herein that as many TEM techniques as available in a given instrument are essential for a comprehensive nano-scale analysis of nanomaterials.
KAUST Department:
Imaging and Characterization Core Lab
Citation:
Anjum DH (2016) Characterization of nanomaterials with transmission electron microscopy. IOP Conference Series: Materials Science and Engineering 146: 012001. Available: http://dx.doi.org/10.1088/1757-899X/146/1/012001.
Publisher:
IOP Publishing
Journal:
IOP Conference Series: Materials Science and Engineering
Conference/Event name:
14th International Symposium on Advanced Materials, ISAM 2015
Issue Date:
Aug-2016
DOI:
10.1088/1757-899X/146/1/012001
Type:
Conference Paper
ISSN:
1757-8981; 1757-899X
Sponsors:
KAUST is acknowledged for the financial support.
Additional Links:
http://stacks.iop.org/1757-899X/146/i=1/a=012001
Appears in Collections:
Conference Papers; Advanced Nanofabrication, Imaging and Characterization Core Lab

Full metadata record

DC FieldValue Language
dc.contributor.authorAnjum, Dalaver H.en
dc.date.accessioned2016-10-20T11:44:41Z-
dc.date.available2016-10-20T11:44:41Z-
dc.date.issued2016-08en
dc.identifier.citationAnjum DH (2016) Characterization of nanomaterials with transmission electron microscopy. IOP Conference Series: Materials Science and Engineering 146: 012001. Available: http://dx.doi.org/10.1088/1757-899X/146/1/012001.en
dc.identifier.issn1757-8981en
dc.identifier.issn1757-899Xen
dc.identifier.doi10.1088/1757-899X/146/1/012001en
dc.identifier.urihttp://hdl.handle.net/10754/621085-
dc.description.abstractThe field of nanotechnology is about research and development on materials whose at least one dimension is in the range of 1 to 100 nanometers. In recent years, the research activity for developing nano-materials has grown exponentially owing to the fact that they offer better solutions to the challenges faced by various fields such as energy, food, and environment. In this paper, the importance of transmission electron microscopy (TEM) based techniques is demonstrated for investigating the properties of nano-materials. Specifically the nano-materials that are investigated in this report include gold nano-particles (Au-NPs), silver atom-clusters (Ag-ACs), tantalum single-atoms (Ta-SAs), carbon materials functionalized with iron cobalt (Fe-Co) NPs and titania (TiO2) NPs, and platinum loaded Ceria (Pt-CeO2) Nano composite. TEM techniques that are employed to investigate nano-materials include aberration corrected bright-field TEM (BF-TEM), high-angle dark-field scanning TEM (HAADF-STEM), electron energy-loss spectroscopy (EELS), and BF-TEM electron tomography (ET). With the help presented of results in this report, it is proved herein that as many TEM techniques as available in a given instrument are essential for a comprehensive nano-scale analysis of nanomaterials.en
dc.description.sponsorshipKAUST is acknowledged for the financial support.en
dc.publisherIOP Publishingen
dc.relation.urlhttp://stacks.iop.org/1757-899X/146/i=1/a=012001en
dc.rightsContent from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.en
dc.rights.urihttps://creativecommons.org/licenses/by/3.0/en
dc.titleCharacterization of nanomaterials with transmission electron microscopyen
dc.typeConference Paperen
dc.contributor.departmentImaging and Characterization Core Laben
dc.identifier.journalIOP Conference Series: Materials Science and Engineeringen
dc.conference.date2015-10-12 to 2015-10-16en
dc.conference.name14th International Symposium on Advanced Materials, ISAM 2015en
dc.conference.locationIslamabad, PAKen
dc.eprint.versionPublisher's Version/PDFen
kaust.authorAnjum, Dalaver H.en
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