Characterization of Deposited Platinum Contacts onto Discrete Graphene Flakes for Electrical Devices

Handle URI:
http://hdl.handle.net/10754/609435
Title:
Characterization of Deposited Platinum Contacts onto Discrete Graphene Flakes for Electrical Devices
Authors:
Holguin Lerma, Jorge A. ( 0000-0003-0138-9073 )
Abstract:
For years, electron beam induced deposition has been used to fabricate electrical contacts for micro and nanostructures. The role of the contact resistance is key to achieve high performance and efficiency in electrical devices. The present thesis reports on the electrical, structural and chemical characterization of electron beam deposited platinum electrodes that are exposed to different steps of thermal annealing and how they are used in four-probe devices of ultrathin graphite (uG) flakes (<100nm thickness). The device integration of liquid phase exfoliated uG is demonstrated, and its performance compared to devices made with analogous mechanically exfoliated uG. For both devices, similar contact resistances of ~2kΩ were obtained. The electrical measurements confirm a 99.5% reduction in contact resistance after vacuum thermal annealing at 300 °C. Parallel to this, Raman characterization confirms the formation of a nanocrystalline carbon structure over the electrode. While this could suggest an enhancement of the electrical transport in the device, an additional thermal annealing step in air at 300 °C, promoted the oxidation and removal of the carbon shell and confirmed that the contact resistance remained the same. Overall this shows that the carbon shell along the electrode has no significant role in the contact resistance. Finally, the challenges based on topographical analysis of the deposited electrodes are discussed. Reduction of the electrode’s height down to one-third of the initial value, increased surface roughness, formation of voids along the electrodes and the onset of platinum nanoparticles near the area of deposition, represent a challenge for future work.
Advisors:
Costa, Pedro M. ( 0000-0002-1993-6701 )
Committee Member:
Li, Lain-Jong ( 0000-0002-4059-7783 ) ; Ooi, Boon S. ( 0000-0001-9606-5578 )
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program
Program:
Materials Science and Engineering
Issue Date:
3-May-2016
Type:
Thesis
Appears in Collections:
Theses; Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program

Full metadata record

DC FieldValue Language
dc.contributor.advisorCosta, Pedro M.en
dc.contributor.authorHolguin Lerma, Jorge A.en
dc.date.accessioned2016-05-15T06:25:06Zen
dc.date.available2016-05-15T06:25:06Zen
dc.date.issued2016-05-03en
dc.identifier.urihttp://hdl.handle.net/10754/609435en
dc.description.abstractFor years, electron beam induced deposition has been used to fabricate electrical contacts for micro and nanostructures. The role of the contact resistance is key to achieve high performance and efficiency in electrical devices. The present thesis reports on the electrical, structural and chemical characterization of electron beam deposited platinum electrodes that are exposed to different steps of thermal annealing and how they are used in four-probe devices of ultrathin graphite (uG) flakes (<100nm thickness). The device integration of liquid phase exfoliated uG is demonstrated, and its performance compared to devices made with analogous mechanically exfoliated uG. For both devices, similar contact resistances of ~2kΩ were obtained. The electrical measurements confirm a 99.5% reduction in contact resistance after vacuum thermal annealing at 300 °C. Parallel to this, Raman characterization confirms the formation of a nanocrystalline carbon structure over the electrode. While this could suggest an enhancement of the electrical transport in the device, an additional thermal annealing step in air at 300 °C, promoted the oxidation and removal of the carbon shell and confirmed that the contact resistance remained the same. Overall this shows that the carbon shell along the electrode has no significant role in the contact resistance. Finally, the challenges based on topographical analysis of the deposited electrodes are discussed. Reduction of the electrode’s height down to one-third of the initial value, increased surface roughness, formation of voids along the electrodes and the onset of platinum nanoparticles near the area of deposition, represent a challenge for future work.en
dc.language.isoenen
dc.subjectContacten
dc.subjectGrapheneen
dc.subjectGraphiteen
dc.subjectDeviceen
dc.subjectAnnealingen
dc.titleCharacterization of Deposited Platinum Contacts onto Discrete Graphene Flakes for Electrical Devicesen
dc.typeThesisen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentMaterials Science and Engineering Programen
thesis.degree.grantorKing Abdullah University of Science and Technologyen_GB
dc.contributor.committeememberLi, Lain-Jongen
dc.contributor.committeememberOoi, Boon S.en
thesis.degree.disciplineMaterials Science and Engineeringen
thesis.degree.nameMaster of Scienceen
dc.person.id133257en
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