Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance

Handle URI:
http://hdl.handle.net/10754/606961
Title:
Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance
Authors:
Selzer, Franz; Floresca, Carlo; Kneppe, David; Bormann, Ludwig; Sachse, Christoph; Weiß, Nelli; Eychmüller, Alexander; Amassian, Aram ( 0000-0002-5734-1194 ) ; Müller-Meskamp, Lars; Leo, Karl
Abstract:
We measure basic network parameters of silvernanowire (AgNW) networks commonly used as transparent conductingelectrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistanceRNW of a single nanowire shows a value of RNW=(4.96±0.18) Ω/μm. The junction resistanceRJ differs for annealed and non-annealed NW networks, exhibiting values of RJ=(25.2±1.9) Ω (annealed) and RJ=(529±239) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistanceRS of the entire network. Extrapolating RJ to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible RS reduction by only ≈20% (common RS≈10 Ω/sq). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Citation:
Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance 2016, 108 (16):163302 Applied Physics Letters
Publisher:
AIP Publishing
Journal:
Applied Physics Letters
Issue Date:
19-Apr-2016
DOI:
10.1063/1.4947285
Type:
Article
ISSN:
0003-6951; 1077-3118
Sponsors:
This work was funded by the European Community’s Seventh Framework Program (FP7/2007-2013) under Grant Agreement No. 314068 and within the DFG Cluster of Excellence “Center for Advancing Electronics Dresden.”
Additional Links:
http://scitation.aip.org/content/aip/journal/apl/108/16/10.1063/1.4947285
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorSelzer, Franzen
dc.contributor.authorFloresca, Carloen
dc.contributor.authorKneppe, Daviden
dc.contributor.authorBormann, Ludwigen
dc.contributor.authorSachse, Christophen
dc.contributor.authorWeiß, Nellien
dc.contributor.authorEychmüller, Alexanderen
dc.contributor.authorAmassian, Aramen
dc.contributor.authorMüller-Meskamp, Larsen
dc.contributor.authorLeo, Karlen
dc.date.accessioned2016-04-25T13:54:39Zen
dc.date.available2016-04-25T13:54:39Zen
dc.date.issued2016-04-19en
dc.identifier.citationElectrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance 2016, 108 (16):163302 Applied Physics Lettersen
dc.identifier.issn0003-6951en
dc.identifier.issn1077-3118en
dc.identifier.doi10.1063/1.4947285en
dc.identifier.urihttp://hdl.handle.net/10754/606961en
dc.description.abstractWe measure basic network parameters of silvernanowire (AgNW) networks commonly used as transparent conductingelectrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistanceRNW of a single nanowire shows a value of RNW=(4.96±0.18) Ω/μm. The junction resistanceRJ differs for annealed and non-annealed NW networks, exhibiting values of RJ=(25.2±1.9) Ω (annealed) and RJ=(529±239) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistanceRS of the entire network. Extrapolating RJ to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible RS reduction by only ≈20% (common RS≈10 Ω/sq). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries.en
dc.description.sponsorshipThis work was funded by the European Community’s Seventh Framework Program (FP7/2007-2013) under Grant Agreement No. 314068 and within the DFG Cluster of Excellence “Center for Advancing Electronics Dresden.”en
dc.language.isoenen
dc.publisherAIP Publishingen
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/apl/108/16/10.1063/1.4947285en
dc.rightsArchived with thanks to Applied Physics Lettersen
dc.titleElectrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistanceen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalApplied Physics Lettersen
dc.eprint.versionPublisher's Version/PDFen
dc.contributor.institutionInstitut für Angewandte Photophysik (IAPP), Technische Universität Dresden, D-01062 Dresden, Germanyen
dc.contributor.institutionNanoInstruments Division, DCG Systems, Richardson, Texas 75081, USAen
dc.contributor.institutionPhysikalische Chemie, Technische Universität Dresden, D-01062 Dresden, Germanyen
dc.contributor.institutionCanadian Institute for Advanced Research (CIFAR), Toronto, Ontario CA-M5G 1Z8, Canadaen
dc.contributor.affiliationKing Abdullah University of Science and Technology (KAUST)en
kaust.authorAmassian, Aramen
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