Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale

Handle URI:
http://hdl.handle.net/10754/599425
Title:
Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale
Authors:
Rivnay, Jonathan; Mannsfeld, Stefan C. B.; Miller, Chad E.; Salleo, Alberto; Toney, Michael F.
Abstract:
A study was conducted to demonstrate quantitative determination of organic semiconductor microstructure from the molecular to device scale. The quantitative determination of organic semiconductor microstructure from the molecular to device scale was key to obtaining precise description of the molecular structure and microstructure of the materials of interest. This information combined with electrical characterization and modeling allowed for the establishment of general design rules to guide future rational design of materials and devices. Investigations revealed that a number and variety of defects were the largest contributors to the existence of disorder within a lattice, as organic semiconductor crystals were dominated by weak van der Waals bonding. Crystallite size, texture, and variations in structure due to spatial confinement and interfaces were also found to be relevant for transport of free charge carriers and bound excitonic species over distances that were important for device operation.
Citation:
Rivnay J, Mannsfeld SCB, Miller CE, Salleo A, Toney MF (2012) Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale. Chem Rev 112: 5488–5519. Available: http://dx.doi.org/10.1021/cr3001109.
Publisher:
American Chemical Society (ACS)
Journal:
Chemical Reviews
KAUST Grant Number:
KUS-C1-015-21
Issue Date:
10-Oct-2012
DOI:
10.1021/cr3001109
PubMed ID:
22877516
Type:
Article
ISSN:
0009-2665; 1520-6890
Sponsors:
The authors would like to thank M. Chabinyc, H. Ade, B. Collins, R. Noriega, K. Vandewal, and D. Duong for fruitful discussions in the preparation of this review. Stanford Synchrotron Radiation Lightsource (SSRL) is a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. This publication was partially supported by the Center for Advanced Molecular Photovoltaics (Award No. KUS-C1-015-21), made by King Abdullah University of Science and Technology (KAUST).
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Publications Acknowledging KAUST Support

Full metadata record

DC FieldValue Language
dc.contributor.authorRivnay, Jonathanen
dc.contributor.authorMannsfeld, Stefan C. B.en
dc.contributor.authorMiller, Chad E.en
dc.contributor.authorSalleo, Albertoen
dc.contributor.authorToney, Michael F.en
dc.date.accessioned2016-02-28T05:50:53Zen
dc.date.available2016-02-28T05:50:53Zen
dc.date.issued2012-10-10en
dc.identifier.citationRivnay J, Mannsfeld SCB, Miller CE, Salleo A, Toney MF (2012) Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale. Chem Rev 112: 5488–5519. Available: http://dx.doi.org/10.1021/cr3001109.en
dc.identifier.issn0009-2665en
dc.identifier.issn1520-6890en
dc.identifier.pmid22877516en
dc.identifier.doi10.1021/cr3001109en
dc.identifier.urihttp://hdl.handle.net/10754/599425en
dc.description.abstractA study was conducted to demonstrate quantitative determination of organic semiconductor microstructure from the molecular to device scale. The quantitative determination of organic semiconductor microstructure from the molecular to device scale was key to obtaining precise description of the molecular structure and microstructure of the materials of interest. This information combined with electrical characterization and modeling allowed for the establishment of general design rules to guide future rational design of materials and devices. Investigations revealed that a number and variety of defects were the largest contributors to the existence of disorder within a lattice, as organic semiconductor crystals were dominated by weak van der Waals bonding. Crystallite size, texture, and variations in structure due to spatial confinement and interfaces were also found to be relevant for transport of free charge carriers and bound excitonic species over distances that were important for device operation.en
dc.description.sponsorshipThe authors would like to thank M. Chabinyc, H. Ade, B. Collins, R. Noriega, K. Vandewal, and D. Duong for fruitful discussions in the preparation of this review. Stanford Synchrotron Radiation Lightsource (SSRL) is a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. This publication was partially supported by the Center for Advanced Molecular Photovoltaics (Award No. KUS-C1-015-21), made by King Abdullah University of Science and Technology (KAUST).en
dc.publisherAmerican Chemical Society (ACS)en
dc.titleQuantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scaleen
dc.typeArticleen
dc.identifier.journalChemical Reviewsen
dc.contributor.institutionStanford University, Palo Alto, United Statesen
dc.contributor.institutionStanford Synchrotron Radiation Laboratory, Menlo Park, United Statesen
kaust.grant.numberKUS-C1-015-21en
kaust.grant.fundedcenterCenter for Advanced Molecular Photovoltaics (CAMP)en
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